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ATML Status April 2008 Issue 15

ATML Status April 2008 Issue 15. An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees. ATML.

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ATML Status April 2008 Issue 15

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  1. ATML StatusApril 2008Issue 15 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees

  2. ATML • ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard • ATML defines a framework through which different architectures using XML can be implemented. • defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. • Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process. • defines the XML format that these elements. • The ATML specifications will define: • How to define XML schemas that represent ATE and test information. • A set of XML schemas supporting the exchange of specific ATE and test information. • The ATML specifications will support: • services that can be used for exchanging ATE and test information in a distributed net-centric environment. • services supporting the exchange of specific ATE and test information in specific common areas.

  3. Errata to Standard Draft revision of a standard Standard approved by the approved by the IEEE IEEE In IEEE Ballot Process Draft of the Standard Key : Started ATML ATML Overview and Architecture IEEE Std 1671 - 2006 Signal Descriptions : STD IEEE Std 1641 - 2004 Instrument Description ( 1671 . 2 ) Test Station ( 1671 . 6 ) Test Adapter ( 1671 . 5 ) Diagnostics : AI - ESTATE Test Configuration IEEE Std 1232 - 2002 IEEE Std 1671 . 4 - 2008 UUT Description IEEE Std 1671 . 3 - 2008 Test Description ( 1671 . 1 ) SIMICA Maintenance Action Information ( 1636 . 2 ) SIMICA Test Results and Session Information IEEE Std 1636 . 1 - 2007 ATML Common , HardwareCommon , TestEquipment , and Capabilities ( 1671 )

  4. SCC20 & ATML Organisations • The IEEE SCC20 is the standards organisation through which the ATML components (i.e. schemas and documentation) will be published under various IEEE standards. • The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. • The ATML group provides draft schemas and associated documents, examples, use cases, requirements and conducts trial use of any ATML components. • Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.

  5. SCC20 Organisation for 2008 SCC 20 Steering and Administrative Chair : Mike Seavey ( Northrop Grumman ) Vice Chair : John Sheppard ( Johns Hopkins University ) Secretary : Dave Droste ( DRS - TEM ) IEEE Staff Liaison Soo H . Kim ( S . H . Kim @ IEEE . ORG ) Liaisons Administrative ( ADMIN ) John Sheppard ( CS ) , Joe Stanco & Mark Kaufman ( I & M ) , Les Orlidge ( AAI ) Joe Stanco ( AES ) , Bill Ross ( DoD ) , Malcolm Brown ( MoD ) , John Sheppard ( Johns Hopkins University ) Les Orlidge ( NDIA ) Diagnostic and Maintenance Control ( DMC ) Hardware Interfaces ( HI ) Test and ATS Description ( TAD ) Test Information Integration ( TII ) Co - Chair : Tim Wilmering ( Boeing ) Co - Chair : Mike Stora ( SysIntech ) Co - Chair : Ashley Hulme ( EADS ) Co - Chair : Teresa Lopes ( Teradyne ) Co - Chair : Mark Kaufman ( NWSC / Corona ) Co - Chair : Dave Droste ( DRS - TEM ) Co - Chair : Ion Neag ( Reston Software ) Co - Chair : Chris Gorringe ( EADS ) Secretary : John Sheppard ( Johns Hopkins Secretary : Dave Droste ( DRS - TEM ) Secretary : Secretary : John Ralph ( Northrop Grumman ) University ) IEEE - 1671 IEEE - 1505 ATML Overview and IEEE - 1232 IEEE - 1641 Receiver Fixture Interface Architecture AI - ESTATE STD ( RFI ) Capabilities Common , IEEE - P 1505 . 1 IEEE - P 1636 IEEE - 1641 . 1 HardwareCommon , Common Test Interface Pin SIMICA Guide to the use of STD TestEquipment Map IEEE - 1636 . 1 IEEE - P 1505 . 2 IEEE - 716 IEEE - 1671 . 3 Test Results and Session 2 - Tier RFI C / ATLAS UUT Description Information IEEE - P 1636 . 2 IEEE - 771 IEEE - 1671 . 4 MAI Guide to the use of ATLAS Test Configuration IEEE - 1445 IEEE - P 1671 . 1 IEEE - P 1671 . 5 Key : DTIF Test Description Test Adapter ATML Component IEEE - 1546 IEEE - P 1671 . 2 IEEE - P 1671 . 6 Errata DTIF Guide Instrument Description Test Station Synthetic Instruments : Synthetic Instrument Annexes IEEE - 1522 UpConverter , Proposed Testability and DownConverter , ATML Users Guide Diagnosability ARB , Digitizer Pins , Ports & Connectors

  6. ATML’s 2008 Objectives & Goals • To have the P1671.2 (Instrument Description) Trial-Use Standard: • complete the formal ballot process by May 2008 • to submit as a trial-use standard by Q3 2008 • To have the P1671.5 (Test Adapter) Trial-Use Standard: • complete the formal ballot process by Jul 2008 • to submit as a trial-use standard by Q3 2008 • To have the P1671.6 (Test Station) Trial-Use Standard: • complete the formal ballot process by Jul 2008 • to submit as a trial-use standard by Q3 2008 • To have the P1671.1 (Test Description) Trial-Use Standard: • written, reviewed and to start the formal ballot process by May 2008 • Ready for publication Dec 2008 • to submit as a trial-use standard by Q5 2008

  7. ATML’s 2008 Objectives & Goals (cont) • Review associated candidate schemas for all ATML components • Q1 • Signal Description (STD - 1641) Errata v2 • Q3 • Update 1671-2006 & errata for draft full use standard • Q4 • Signal Description (STD - 1641) Dec 2008 Start Ballot • Review All IEEE Std 1671 ATML Components (P1671.1 thru P1671.6 & P1636.1) in line with 1671 draft Full Use Standard

  8. Standards & Schema Revisions (1 of 2)

  9. Standards & Schema Revisions (2 of 2)

  10. ATML Overview & Architecture (IEEE Std 1671-2006) • IEEE Std 1671-2006 • Published December 16, 2006 • Common schema Version 1.01 • HardwareCommon Version 1.01 • Errata Document to “replace” published Annex B • Presently at Draft 10 • Errata until 2009; to be posted on IEEE Errata web-site • Common schema Version 2.01 • HardwareCommon schema Version 2.02 • TestEquipment schema Version 0.16 • Published IEEE Std 1671™-2006 did not include Test Equipment

  11. ATML Overview & Architecture (cont) • ATML Capabilities • Proposed as “new” Annex C • Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site • Annex Document presently at Draft 1.1 • Capabilities schema Version 0.04 • ATML Pins, Ports, Connectors • Material to be posted on the TII web-site • Future ATML Users Guide

  12. ATML Test Description (P1671.1)

  13. ATML Instrument Description (P1671.2)

  14. ATML Instrument Description (cont)

  15. ATML UUT Description (IEEE Std 1671.3-2008)

  16. ATML UUT Description (cont)

  17. ATML UUT Description (cont)

  18. ATML Test Configuration IEEE Std 1671.4-2008

  19. ATML Test Configuration (cont)

  20. ATML Test Configuration (cont)

  21. ATML Test Adapter (P1671.5)

  22. ATML Test Station (P1671.6)

  23. ATML & SIMICA(IEEE-1636.1) • SIMICA:Test Results and Session Information • IEEE Std 1636.1-2007 • TestResults schema Version 2.03

  24. ATML & STD (IEEE-1641) • STD: (Update to IEEE Std 1641-2004) • Draft updated standard under development • Draft updated schemas under development • Start Ballot December 2008

  25. Balloting - Spanning Calendar Years • Clarification • Once the initial ballot begins, the ballot group is set until all rounds of balloting are finished. • Even if a ballotter does not renew his or her IEEE membership. • myProject and myBallot accounts remain active only for activities selected while IEEE membership was active. • myProject will indicate that IEEE membership has expired. • All votes and comments are valid, and are to be handled as any other IEEE-SA member. • The IEEE does not wish to re-establish balloting constituencies.

  26. IEEE Std1671-2006 Schema & Document Locations

  27. 2008 Meeting Schedule • Face-to-Face Meetings: • Jan. 15-17; Orlando, FL (Lockheed Martin) • Apr. 22nd-24th ; SCC20 08-1 St. Louis, MO (Boeing) • Jul. TBA; Open - meeting presently planned for Santa Rosa • 6-8th Sept.; SCC20 08-2 Salt Lake City, UT • In conjunction with AUTOTESTCON (Sept. 8-11) • Oct./Nov. TBD; Open - no meeting presently planned • Additionally: • Bi-Weekly Teleconferences • 4 Meetings a year plus additional break-out working groups as necessary • Synchronise with SCC20 meetings

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