1 / 22

Department of Electronics

Advanced Information Storage 14. Atsufumi Hirohata. Department of Electronics. 17:00 18/November/2013 Monday (AEW 105). Quick Review over the Last Lecture. 6T-SRAM (static random access memory) operation :. EEPROM (electrically erasable read only memory) :.

chiku
Télécharger la présentation

Department of Electronics

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Advanced Information Storage 14 Atsufumi Hirohata Department of Electronics 17:00 18/November/2013 Monday (AEW 105)

  2. Quick Review over the Last Lecture 6T-SRAM (static random access memory) operation : EEPROM (electrically erasable read only memory) : * http://allthingsvlsi.wordpress.com/tag/6t-sram-operation/; * http://www.answers.com/topic/eeprom

  3. 14 Magnetic Random Access Memory • Non-volatility • Read-out operation • Spin-transfer torque • Coherent tunnelling • Perpendicular magnetisation • Content addressable memory

  4. Memory Types Dynamic Rewritable Volatile DRAM SRAM Static Non-volatile Static MRAM FeRAM PRAM Read only Non-volatile PROM Static Mask ROM Read majority (Writable) Flash Non-volatile Static EPROM * http://www.semiconductorjapan.net/serial/lesson/12.html

  5. Advantages of MRAM * After K. Inomata, J. Magn. Soc. Jpn. 23, 1826 (1999).

  6. Magnetic Random Access Memory Basic operation of magnetic random access memory (MRAM) : * S. S. P. Parkin, 1st Int'l Sch. on Spintronics and Quantum Info. Tech., May 13-15, 201 (Maui, HI, USA).

  7. MRAM Cell MRAM cell structure : MRAM read-out : Bit line Sensing current Magnetic free layer Magnetic tunnel / spin-valve junctions Insulator / nonmagnet Magnetic pin layer Word line Selection transistor (MOSFET) Parallel magnetisation ↓ Low resistant state “0” Antiparallel magnetisation ↓ High resistant state “1” * http://www.wikipedia.org/

  8. MRAM Products Freescale (now EverSpin Technologies) 4 Mbit MRAM : * http://www.freescale.com/; ** http://www.chipworks.com/blogs.aspx?id=2514

  9. Improved MRAM Operation Required writing currents for several techniques dependent upon cell size: Ampère-field-induced magnetisation reversal with a ferromagnetic overlayer (Current technology) Ampère-field-induced magnetisation reversal without a ferromagnetic overlayer (Current technology) Current-induced magnetisation reversal JC ~ 10 7 A / cm 2 (Current technology) Write current (mA) Current-induced magnetisation reversal JC ~ 10 6 A / cm 2 Current-induced magnetisation reversal JC ~ 5  10 5 A / cm 2 MRAM cell size (µm) * S. Nakamura, Y. Saito and H. Morise, Toshiba Rev. 61, 40 (2006).

  10. Current-Induced Magnetisation Reversal Anti-parallel (AP)  parallel (P) reversal in a GMR / TMR junction : Spin-transfer torque (STT) ** * M. Oogane and T. Miyazaki, “Magnetic Random Access Memory,” in Epitaxial Ferromagnetic Films and Spintronic Applications, A. Hirohata and Y.Otani (Eds.)(Research Signpost, Kerala, 2009) p. 335. ** J. Slonczewski, J. Magn. Magn. Mater. 159, L1 (1996); L. Berger, Phys. Rev. B 54, 9353 (1996).

  11. STT-MRAM Products In 2012, EverSpin Technologies introduced 64 Mbit MRAM : * http://www.everspin.com/

  12. STT-MRAM Advantages 1 * http://www.everspin.com/

  13. STT-MRAM Advantages 2 * http://www.everspin.com/

  14. Spin-Dependent Electron Tunneling Atom 1 Barrier Atom 2 r(r ) 3d 4p 4s r Jullière's model : FM / insulator / FM junctions * * M. Jullière., Phys. Rep. 54A, 225 (1975).

  15. TMR for Device Applications NOT following Jullière's model : ** TMR =2P1P2/(1-P1P2) ** S. S. P. Parkin, 1st Int'l Sch. on Spintronics and Quantum Info. Tech., May 13-15, 2001 (Maui, HI, USA). Recent progress in TMR ratios : > 400 % (604 % in 2008) TMR ratio has been achieved !  > Gbit MRAM can be realised. * M. Jullière., Phys. Rep. 54A, 225 (1975);

  16. Improved Tunnel Barriers Epitaxial (oriented) barriers : * 1 2 , 5 1 2 , 5 • Disorder at the interface : • FM over-oxidation • lattice defects Defects in the barrier • Disorder at the interface : • FM over-oxidation • lattice defects • island growth of the barrier Conventional amorphous barriers : * * After S. Yuasa et al., 28th Annual Conference on Magnetics, Sep. 21-24, 2004 (Okinawa, Japan).

  17. Perpendicular MTJ In 2007, Toshiba demonstrated STT operation with perpendicular magnetisation : * * http://www.toshiba.co.jp/

  18. Advantages of Perpendicular MTJ Energy barrier can be lowered using perpendicular magnetisation : * Magnetisation reversal by spin-transfer torque Magnetisation reversal by spin-transfer torque Easy axis Easy axis Magnetisation reversal by thermal fluctuation Magnetisation reversal by thermal fluctuation Energy Energy 50-nm perpendicular MTJ In-plane magnetisation Perpendicular magnetisation Resistance Voltage [V] * http://www.toshiba.co.jp/

  19. Content Addressable Memory (CAM) In 2011, NEC and Tohoku University announced a new memory concept : * • Fast latency : 5 ns • Low power consumption : 9.4 mW • 50 % area reduction by sharing transistors * http://www.csis.tohoku.ac.jp/

  20. Thermally Assisted (TA)-MRAM Crocus demonstrated 1-Mbit MRAM with thermally assisted STT operation : * * I. L. Prejbeanuet al., J. Phys. D: Appl. Phys.46, 074002 (2013).

  21. Reduced Energy Consumption 3-orders of reduction in energy consumption was demonstrated by UCLA team : * Voltage-induced magnetisation reversal was used. * http://newsroom.ucla.edu/portal/ucla/ucla-engineers-have-developed-241538.aspx

  22. Comparison between Next-Generation Memories * http://techon.nikkeibp.co.jp/article/HONSHI/20070926/139715/

More Related