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Boom Electronics Board (BEB) Engineering Peer Review Apr. 20, 2004 Hilary Richard

Boom Electronics Board (BEB) Engineering Peer Review Apr. 20, 2004 Hilary Richard. BEB Requirements. Functional Requirements Spin Plane Booms, for each provide: Floating Ground Driver “Bias”, “Guard”, “Usher” programmable potentials “Braid” programmable, switchable potential

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Boom Electronics Board (BEB) Engineering Peer Review Apr. 20, 2004 Hilary Richard

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  1. Boom Electronics Board (BEB)Engineering Peer ReviewApr. 20, 2004Hilary Richard

  2. BEB Requirements • Functional Requirements • Spin Plane Booms, for each provide: • Floating Ground Driver • “Bias”, “Guard”, “Usher” programmable potentials • “Braid” programmable, switchable potential • AC test signal source • Axial Booms, for each provide: • Floating Ground Driver • “Bias”, “Guard”, “Usher” programmable potentials • AC test signal source

  3. BEB Requirements, con’t.

  4. BEB Analog Electronics

  5. BEB Block Diagram

  6. Braid Bias

  7. Preliminary PCB Layout

  8. BEB ETU

  9. BEB ETU

  10. BEB Parts Analysis • Parts Stress Analysis • Design meets derating guidelines of GSFC PPL-21 • Worst Case Temperature Analysis • Parts meet Temperature Guidelines • Operating Temperature range: –30C to 45C • Survival Temperature range: –50C to 65C • Only one “high” power device (Actel 54SX72) • Operating power dissipation: 63 mW

  11. BEB ETU Mass and Power • Power • Estimated worst case power at PDR: 1667mW • Includes Preamp power of 324mW • Measured ETU operating power: 790mW • Including Preamp, total = 1114mW • Mass • Estimated mass at PDR: 504g • Measured ETU mass: 426g

  12. BEB ETU Test Results DC Response of Floating Ground Driver, FL_GND2

  13. BEB ETU Test Results, con’t. AC Response of Floating Ground Driver, FL_GND2

  14. BEB ETU Test Results, con’t. DC Response of Bias Driver, BIAS1

  15. BEB ETU Test Results, con’t. AC Response of Bias Driver, BIAS1

  16. BEB ETU Test Results, con’t. • Preliminary Crosstalk Data • Set-up: • Signal Injected into Ref. Voltage of BIAS3 • VSphere3 = 10VPP, 150Hz • Output of neighboring BIAS Driver examined • Crosstalk observed on BIAS2: • VSphere2 not terminated • Signal Amplitude is -75.8dB (relative to 7.07VRMS ) • VSphere2 grounded • Crosstalk undetectable (< -103dB)

  17. BEB / EFI Subsystem Test • Integrated Testing • Includes: • BEB, Boom wire, Preamp • Sensor Boxes with Plasma Simulator (R║C) • GSE Automated Data Acquisition • Test Results • DC Tests • Isolation, Sensor biasing, Usher/Guard Biasing, Braid biasing • DC Gain/Offset • AC Tests • AC input impedance, Transfer function, Crosstalk, Noise level • Linearity, Slew rate

  18. EFI Test/Characterization

  19. BEB GSE Data Acquisition

  20. BEB GSE Data Acquisition • Capabilities: • Supports Automated test of Flight Hardware • “VME-style” backplane • Accepts BEB and DFB • DCB-simulator implements CDI command • 16-Channel 16-bit ADC (±100V range) • 6 Vsphere, 2 Braid, 2 Usher, 2 Guard, 2 Flt. Gnd • Programmable Signal Source w/ • ±60Vdc offset range • 30mV to 15Vpp AC (DC-16kHz) • 1mV to 500mVpp AC (100k – 500kHz) • LVPS and PCB simulation • Power services programmable on/off • +5VD, +2.5VD, ±10VA, ±100VA • Current monitors

  21. BEB GSE Software • Capabilities: • Scripted or interactive entry of CDI, GPIB, and DAQ commands • Continuous analog acquisition mode with real-time stripchart displays • “One-shot” acquisition mode for detailed examination, processing, and archival of analog input data • MATLAB interface • TCP/IP interface allows GSE to be controlled via remote host • Full access to CDI, GPIB, analog and digital I/O commands • Interface libraries allow GSE functions to be accessed just like native MATLAB commands • Device control • GPIB programmable function generator serves as signal source • DAQPad 16-input, 16-bit, 333 kSamp/sec for analog data acquisition • DAQPad analog and digital outputs serve as controls for signal source amplifier, LVPS switching, and current monitor MUX • TCP/IP interface to 6U VME GSE Interface Board for sending CDI commands

  22. BEB GSE Software, con’t.

  23. BEB Design Status • Completed ETU Design and Fabrication • Characterization w.r.t. DC gain and AC response • In progress • Available for testing with Preamp prototypes • EFI Sensor Test Program • GSE Data Acquisition system completed • Integrated tests with preamps and boom units • Issues • Actel 54SX72 failures, total of 4 out of 7 • 2 failed programming • 2 failed “in circuit”, cause unknown

  24. BEB Add’l Info • Additional slides included: • Floating ground driver schematic • Bias driver schematic

  25. Floating Ground Driver • Heritage Design • CLUSTER, POLAR, FAST • Minor changes in part selection

  26. Bias Driver • Heritage Design • CLUSTER, POLAR, FAST • Minor changes in parts selection and DAC

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