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How To Measure Thin Film Systems?

There are many technologies out there to measure the thickness of the thinnest of the films or the lens coating thickness. Some of these technologies make use of the data analysis algos written especially for hard coat applications.

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How To Measure Thin Film Systems?

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  1. How To Measure Thin Film Systems? There are many technologies out there to measure the thickness of the thinnest of the films or the lens coating thickness. Some of these technologies make use of the data analysis algos written especially for hard coat applications. Ever wondered how to measure the thickness of the film present on the eyeglasses, or hard coat layers on headlights in the manufacturing, or the bio-compatible coatings on the medical devices? Using Manual Probe With manual probes the coating on the curved surfaces can be measured quickly and reliably. These probes are usually available in two variants: CSH which is used to measure the thickness lesser than 2mm CSHF is used to measure the thickness lesser than 200 microns. It depends on the application which probe should be used. These probes are accurate and are used to measure the parts which are larger than one inch. There are applications which can measure even the most challenging of the samples. The measurement process is as well so that even the most inexperienced persons can use and understand the probe. NanoCalc It uses the well-known measurement principle of interference of light in thin layers. When the light is reflected, it results in phase shifts and

  2. superpositions of amplitudes add up-to different intensities for different wavelengths. This phenomenon is known as thin film interference and its best example in the real world is the shimmering soap bubbles when it is completely illuminated. The technique uses the broadband source of light to generate a wave length dependent reflectance data. A fit to this data requires very good knowledge of the wavelength dependence of the refractive index and the extinction coefficient. The value of the parameters is then looked up in the tables. Once the values of refractive index and extinction coefficient are there the absolute value of the thickness can be calculated to a very level of the accuracy. Thus reflectometery is very good for doing thin film analysis and the NanoCalc system is able to measure the stack up-to ten layers.. They provide resolution to 0.1nm and are available in various wavelength configurations. So there are various methods to measure the lens coating thickness with high degree of accuracy, and with the use of the right software the relevant data can be obtained very quickly and accurately.

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