1 / 25

PROGRESS IN NEAR-FIELD MICROWAVE MICROSCOPY OF SUPERCONDUCTING MATERIALS

Tamin Tai, Steven M. Anlage Department of Physics Center for Nanophysics and Advanced Materials University of Maryland 19 February, 2010. PROGRESS IN NEAR-FIELD MICROWAVE MICROSCOPY OF SUPERCONDUCTING MATERIALS. Funding from Department of Energy NSF Division of Materials Research

Télécharger la présentation

PROGRESS IN NEAR-FIELD MICROWAVE MICROSCOPY OF SUPERCONDUCTING MATERIALS

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Tamin Tai, Steven M. Anlage Department of Physics Center for Nanophysics and Advanced Materials University of Maryland 19 February, 2010 PROGRESS IN NEAR-FIELD MICROWAVE MICROSCOPY OF SUPERCONDUCTING MATERIALS Funding from Department of Energy NSF Division of Materials Research Maryland Center for Nanophysics and Advanced Materials 6th SRF Materials Workshop NHMFL, Tallahassee, Florida

  2. APPROACH GOAL: To establish links between microscopic defects and the ultimate RF performance of Nb at cryogenic temperatures APPROACH: Work with the SRF community to develop well- characterized defects and subject them to 2 forms of microscopy: Near-Field Microwave Microscopy Laser Scanning Microscopy

  3. NEAR-FIELD MICROWAVE MICROSCOPY The Idea 1) Stimulate Nb with a concentrated and intense RF magnetic field • Drive the material into nonlinearity (nonlinear Meissner effect) • Why the NLME? It is very sensitive to defects… • Measure the characteristic field scale for nonlinearity: JNL 4) Map out JNL(x,y) 5) Relate JNL(x,y) maps to candidate defects Leads to Harmonic Generation f → 3f, etc. Meissner-state properties now depend on current J → Nonlinearities in inductance and loss l(T, JRF) JRF

  4. How to Generate Strong RF Magnetic Fields? Magnetic recording heads provide strong and localized BRF BRF ~ 1 Tesla Lateral size ~ 100 nm

  5. Magnetic Recording Head Slider Cross-section (next slide) Au bond pads to reader and writer Read/Write Head Air bearing surface Thickness (~1.2 mm) Suspension

  6. Magnetic Recording Head Cross Section Cu coils Permalloy shields m ~2 m Write Pole Read Sensor 2 mm RF Magnetic Fields Air bearing surface

  7. Measured Input Impedance of Write Head Impedance Matched to 50 W Seagate Longitudinal Head Pole width ~ 200 nm Pole gap ~ 100 nm Pole thickness ~ 1 mm Coil turns 6 ~ 8

  8. Next Generation Experiment We need higher BRF and strongly localized field distributions RF Coil on slider Superconductor D. Mircea, Phys. Rev. B 80, 144505 (2009) Goals: BRF ~ 200 mT Lateral size ~ 100 nm

  9. What do We Learn About the Superconductor? Simulated current distribution beneath probe Induce high m0K ~ 200 mT K(x,y) sharply peaked in space ► Better spatial resolution Current distribution geometry factor D. Mircea, SMA, Phys. Rev. B 80, 144505 (2009) + references therein

  10. What do We Learn About the Superconductor? P3f(x) JNL(x) Position x Defect 1 Defect 2 P3f

  11. NEAR-FIELD MICROWAVE MICROSCOPY Expected Outcome Locally (< 1 mm) stimulate Nb surface with large (BRF ~ 200 mT) RF field and induce nonlinear response Map JNL(x,y) and relate to known defects Catalog of Defects and their Superconducting RF Properties

  12. Measurements on Tl2Ba2CaCu2O8 Film At a fixed location ~40 dB higher response expected Vortex Nonlinearity? Tc Noise floor

  13. Accomplishments Suppressed background nonlinearity (3f) from write head Proven that heads are impedance matched Seeing clear, reproducible signal from superconducting sample Receiving technical assistance from the magnetic recording industry Dragos Mircea, Sining Mao (Western Digital) Tom Clinton (Seagate → Nth Degree) Unresolved Issues Not achieving the P3f response levels expected Gap may be too far from sample: Dirt, roughness Gap may be too close to sample: Gap+SC creates large reluctance Stray fields from slider inducing vortices?

  14. Next Steps Slider gap - sample distance control Micro-Loops G = 1.3 x 106 A3/m2 Original loop probes had G ~ 103 A3/m2 Greg Ruchti, Senior Thesis, UMD

  15. LASER SCANNING MICROSCOPY Experiments in collaboration with Alexey Ustinov and Alexander Zhuravel at Uni. Karlsruhe, Germany New round of experiments in March+April on bulk Nb + films

  16. Conclusions Near-field microwave microscopy and Laser Scanning Microscopy are quantitative measurement techniques capable of addressing important materials issues in Nb The microscopes are flexible, simple, broadband, and have frequency-independent spatial resolution Looking for materials collaborators with well-characterized local defects Objectives: Develop Bsurf ~ 200 mT, mm-scale probes for RF Critical Field imaging Develop compact resonators with Nb coupon samples Relate local cryogenic RF properties to microstructure http://www.cnam.umd.edu/anlage/AnlageHome.htm

  17. LASER SCANNING MICROSCOPY The Idea 1) Create a compact resonant structure involving a Nb coupon 2) While exciting on resonance, scan a focused laser spot on sample • Image the Photo-Thermal effects: JRF(x, y) - RF current density in A/cm2 Thermo-Electric imaging JNL(x,y) – Nonlinearity current scale in A/cm2 RF vortex breakdown, flow, critical state 4) Relate these images to candidate defects

  18. LASER SCANNING MICROSCOPY Preliminary Results

  19. LASER SCANNING MICROSCOPY Preliminary Results on YBa2Cu3O7 Patterned Film DC Critical State Image (T < Tc, I > Ic) Reflectivity Image Thermo-Electric Image (room temperature) JRF(x,y) Image (5.5 GHz, T < Tc)

  20. LASER SCANNING MICROSCOPY Preliminary Results RF Defect Imaging in bulk Nb

  21. LASER SCANNING MICROSCOPY Expected Outcome Candidate Resonant Structures Bulk Nb “Short Sample” structures to measure RF breakdown fields and relate to defects and surface processing Measure RF breakdown fields in SC / Ins / SC / Ins … multilayer samples Gurevich, Appl. Phys. Lett. (2006) Image variations in the thermal healing length to better understand the role of heat dissipation in RF performance

  22. PLANS FOR THE FUTURE Laser Scanning Microscope Collaborators: Dr. Alexander Zhuravel, B. I. Verkin Inst. of Low Temperature Physics Kharkiv, Ukraine Prof. Dr. Alexey Ustinov, University of Karlsruhe, Germany We seek representative samples containing well-characterized defects and/or surface treatments

  23. Acknowledgements Collaborators Post-Docs F. C. Wellstood R. Ramesh J. Melngailis Johan FeenstraAndrew Schwartz C. CanedyA. Stanishevsky Alexander Tselev Graduate Students NSF REU Students David Steinhauer Atif Imtiaz Sheng-Chiang Lee Wensheng Hu Ashfaq Thanawalla Sangjin Hyun (Seoul Nat. Univ.) Dragos Mircea Young-noh Yoon Yi Qi Nadia Fomin (Georgetown) Eric Wang (UC Berkeley) Tom Hartman (Princeton) Industrial Collaborators Undergraduate Students Hans Christen (Neocera) Vladimir Talanov (Neocera  SSM) Robert Hammond (STI) Andrew Schwartz (Neocera) Steve Remillard (Agile Devices) C. P. Vlahacos Sudeep Dutta Jonah Kanner Greg Ruchti Akshat Prasad

  24. Single-tone sinusoidal microwave signal with single frequency input, f Microwave current induced on the sample NEAR-FIELD MICROWAVE MICROSCOPY Preliminary Results 3f : NLME Nonlinearities 2f : Vortex Nonlinearities Superconductor Kmax ~ 50 A/m Bmax ~ 60 mT Create a sample with well-characterized defects and probe them with localized RF currents in the superconducting state

  25. Bi Bi Bi Bi Bi Bi - - - - - - crystal grain boundary crystal grain boundary crystal grain boundary crystal grain boundary crystal grain boundary crystal grain boundary 0 0 0 0 0 0 2 2 2 2 2 2 4 4 4 4 4 4 6 6 6 6 6 6 Y (microns) Y (microns) Y (microns) Y (microns) Y (microns) Y (microns) 8 8 8 8 8 8 10 10 10 10 10 10 0 0 0 0 0 0 2 2 2 2 2 2 4 4 4 4 4 4 6 6 6 6 6 6 8 8 8 8 8 8 10 10 10 10 10 10 X (microns) X (microns) X (microns) X (microns) X (microns) X (microns) STM image of Bi-Crystal Grain Boundary in YBa2Cu3O7 Nonlinear Response Image of Known Defect Bi-Crystal Grain Boundary in YBa2Cu3O7-d y (mm) x (mm) T = 60 K f = 6.5 GHz S.-C. Lee, et al., Phys. Rev. B 72 , 024527 (2005)

More Related