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Engineering Perspectives on Quadrants (2) CLIC09 Workshop KEK Y.Higashi

Engineering Perspectives on Quadrants (2) CLIC09 Workshop KEK Y.Higashi. Contents. Dark current characteristics on the KEK quadrants structure experiment Surface treatment for dark current/EFE mitigation Material FANUC Co. fabrication method proposal (tentative) Assembly envelopments.

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Engineering Perspectives on Quadrants (2) CLIC09 Workshop KEK Y.Higashi

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  1. Engineering Perspectives on Quadrants (2)CLIC09 WorkshopKEKY.Higashi CLIC09 WG4 RF Structure

  2. Contents Dark current characteristics on the KEK quadrants structure experiment Surface treatment for dark current/EFE mitigation Material FANUC Co. fabrication method proposal (tentative) Assembly envelopments CLIC09 WG4 RF Structure

  3. Notice: Deformed cavity wall KEK’s version: 50 micron chamfer Cell 3(×35） Roughness: ~ 5 micron order? Cell 3(×100） Cell3 deformation：0.053mm CLIC09 WG4 RF Structure 2009/10/12 3

  4. QMS (1) :RF Power and gases Pressure of H2 dominated. Pressure of water is inactive. Dark current characteristics on the KEK quadrants structure ~x1000 higher than T18 structure -> Detail is talkby Higo RF Power into Acc 2 18 28 ACC Chamber CCG 44 CLIC09 WG4 RF Structure

  5. Enhanced Field Emission/Dark current(Reference :J. Wang, G. loew) • These can be classified into various categories; • Metallic surface roughness due to imperfect machining, scratches, micro protrusions, “tip-on-tip” productions • Metallic dust, micro particles • Grain boundaries • Molten craters after breakdown • Dielectric impurities and layers • Absorbed gas • Metal-insulator-vacuum (MIV) or metal-insulator-metal (MIM) layers CLIC09 WG4 RF Structure

  6. Surface treatment for dark current/EFE mitigation Out gas characteristics on various treatment of OFC CLIC09 WG4 RF Structure

  7. 50nm nA Field Emission Microscope Check Grain boundaries, impurity, material defect, roughness Potential: 20V, Resistance: 100 Ohm CLIC09 WG4 RF Structure

  8. Ultra High-Precision Diamond Tuning Surface of Copper Class1 Contacted region Inner diameter 35mm Enough quality as metal-metal contact for Quadrants? 60mm Diameter, 6mm thickness PV: 21nm PV: 13nm CLIC09 WG4 RF Structure

  9. Roughness: 3.3nm (PV) Field enhancement occurs? CLIC09 WG4 RF Structure

  10. No vacuum leak was found Leak rate: < 1.7e-11Pal/sec IP (Semicon grade) Rinse (50degC) Degreasing Assembly: Class 100 CLIC09 WG4 RF Structure

  11. Surface Treatment for Quadrants • Pre-machining (remain 100 mm) • 650 degC annealing • Final machining (same surface roughness to disk) • Chemical Etching (~5 mm) • HPWR (remove burs, particle) • Degreasing (remove particle and fine oxide layer) • 150~200 degC baking in vacuum • Assembly in the ILC grade clean room CLIC09 WG4 RF Structure

  12. Material Should be Considered High Gradient Test Results of Single Cell SW Structures CLIC09 WG4 RF Structure

  13. 230mm 45° FANUC Co. fabrication method proposal (tentative) CLIC09 WG4 RF Structure

  14. Cost Estimation (very rough)TD18 structure Unit is MYen Disk Type Quadrants Material Whole fabrication 2.5 2.8 Vacuum chamber - 1.0 Surface treatment 0.5 0.3 Bonding (Assembly) 1.5 0.5 RF Tuning 0 (eventually) 0 (eventually) Absorber Baking 0.5 0.5 Instauration Alignment Total ? CLIC09 WG4 RF Structure

  15. Summary • One order more precise machining (roughness, dimension) technologies glowed up compare to NLC/GLC generation, So Quadrants is very attractive • 2. 5000~7000 disks, 25~30 structures fabricated for NLC/GLC • 3. In order to understand fabrication technologies for high gradient quadrants structures, may be needed 2~3 years CLIC09 WG4 RF Structure

  16. CLIC09 WG4 RF Structure

  17. CLIC09 WG4 RF Structure

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