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Digital Integrated Circuit Design

Digital Integrated Circuit Design. Andrea Bonfanti DEIB Via Golgi 40, Milano. Manufacturing Process. CMOS Process. n-well CMOS Process. Twin-well CMOS Process. Twin-well Trench-Isolated CMOS Process. Triple-well CMOS Process. Circuit Under Design. Its Layout View. nwell. metal1.

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Digital Integrated Circuit Design

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  1. Digital Integrated Circuit Design Andrea Bonfanti DEIB Via Golgi 40, Milano ManufacturingProcess

  2. CMOS Process n-well CMOS Process

  3. Twin-well CMOS Process Twin-well Trench-Isolated CMOS Process

  4. Triple-well CMOS Process

  5. Circuit Under Design

  6. Its Layout View nwell metal1 n+ diffusion poly p+ diffusion n+ diffusion contact p+ diffusion

  7. Its Layout View (2)

  8. Its Layout View (2)

  9. Its Layout View (2)

  10. Photo-Lithographic Process optical mask oxidation photoresist photoresist coating removal (ashing) stepper exposure Typical operations in a single photolithographic cycle (from [Fullman]). photoresist development acid etch process spin, rinse, dry step

  11. Patterning of SiO2 Chemical or plasma etch Si-substrate Hardened resist SiO 2 (a) Silicon base material Si-substrate Photoresist SiO 2 (d) After development and etching of resist, chemical or plasma etch of SiO 2 Si-substrate Hardened resist (b) After oxidation and deposition SiO of negative photoresist 2 Si-substrate UV-light Patterned (e) After etching optical mask Exposed resist SiO 2 Si-substrate Si-substrate (f) Final result after removal of resist (c) Stepper exposure

  12. Define active areas Etch and fill trenches Implant well regions Deposit and pattern polysilicon layer Implant source and drain regions and substrate contacts Create contact and via windows Deposit and pattern metal layers CMOS Process at a Glance

  13. p-epi (a) Base material: p+ substrate with p-epi layer + p Si N 3 4 SiO (b) After deposition of gate-oxide and 2 p-epi sacrificial nitride (acts as a buffer layer) + p (c) After plasma etch of insulating trenches using the inverse of the active area mask p + CMOS Process Walk-Through

  14. SiO 2 (d) After trench filling, CMP planarization, and removal of sacrificial nitride n (e) After n-well and V adjust implants Tp p (f) After p-well and V adjust implants Tn CMOS Process Walk-Through

  15. poly(silicon) (g) After polysilicon deposition and etch n + + p (h) After n + source/drain and p + source/drain implants. These steps also dope the polysilicon. SiO 2 (i) After deposition of SiO 2 insulator and contact hole etch. CMOS Process Walk-Through

  16. Al (j) After deposition and patterning of first Al layer. Al SiO 2 (k) After deposition of SiO 2 insulator, etching of via’s, deposition and patterning of second layer of Al. CMOS Process Walk-Through

  17. Metallization

  18. Advanced Metallization

  19. Design Rules

  20. 3D Perspective Polysilicon Aluminum

  21. Design Rules • Interface between designer and process engineer • Guidelines for constructing process masks • Unit dimension: minimum line width • scalable design rules: lambda parameter • absolute dimensions (micron rules)

  22. Layer Color Representation Well (n) Yellow Active (diffuision n+ or p+) Green Select (n+) Green Polysilicon Red Metal1 Blue Metal2 Magenta Contact To Poly Black Contact To Diffusion (ntap, ptap) Black Via Black Single-well CMOS Process Layers

  23. Layers in 0.25 mm CMOS process

  24. Intra-Layer Design Rules 4 Metal2 3

  25. Transistor Layout (PMOS)

  26. Vias and Contacts

  27. Select Layer

  28. CMOS Inverter Layout

  29. Layout Editor

  30. Design Rule Checker

  31. Design Rule Checker

  32. The final result

  33. Packaging

  34. Packaging Requirements • Electrical: lowparasitics • Mechanical: reliable and robust • Thermal: efficient heat removal • Economical: cheap

  35. Bonding Techniques

  36. Tape-Automated Bonding (TAB)

  37. Flip-Chip Bonding

  38. Package-to-Board Interconnect

  39. Package Types

  40. Package Parameters

  41. Multi-Chip Modules

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