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Beam Position Monitors: Front-End Components

Beam Position Monitors: Front-End Components. BPM Acquisition Architecture Components Selection Irradiation Tests. Logarithmic Amplifier P rinciple. Constraints on LogAmp ICs: Dual Channel and Integrated Difference Amp. Fast response: < 500ns @ 1%. B P Filter. LogAmp. A.

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Beam Position Monitors: Front-End Components

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  1. Beam Position Monitors:Front-End Components BPM Acquisition Architecture Components Selection Irradiation Tests MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  2. Logarithmic Amplifier Principle Constraints on LogAmp ICs: • Dual Channel and Integrated Difference Amp. • Fast response: < 500ns @ 1% BP Filter LogAmp A ADC & Serializer Diff.Amp. Position = K * Vout BP Filter B LogAmp MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  3. MOPOS Architecture Optical Fibres MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  4. Analogue Components The aim is to qualify the components on a test board during a single radiation period. • LogAmps • AD8302: Analog Devices Gain and Phase Detector • ADL5519: Analog Devices Dual Log Detector • MAX2016: Maxim Dual Log Detector MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  5. Analogue Components • AD8302: Analog Devices Gain and Phase Detector MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  6. Analogue Components • ADL5519: Analog Devices Dual Log Detector MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  7. Analogue Components • MAX2016: Maxim Dual Log Detector MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  8. Analogue Components • Low Dropout Regulators • LT1963A: Linear Tech.Low Noise, LDO Regulator • LP3875: National Semi. Low Noise, LDO Regulator • TL1963A: Texas Inst.Low Noise, LDO Regulator • TPS7A4501: Texas Inst.Low Noise, LDO Regulator • ADC Drivers • ADA4932: Analog Devices Differential ADC driver • THS4521: Texas Inst. Differential ADC driver MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  9. Analogue Components • Optical transceivers (T/R: 2 fibers) • AFCT-5705LZ: AvagoSFP Transceiver, 1.25Gb/s • FTLF1318P2BTL: FinisarSFP Transceiver, 1.25Gb/s MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  10. Analogue Components • Bidirectional Gigabit Transceivers (single fiber) • DEM-330T/330R: D-Link • LTE3405/4305: Hisense • SPL-35-GB-BX: Source Photonics MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  11. Radiation Tests for Belle IITakeo Higuchi (KEK); TWEPP2011 1‐year‐equivalent neutron dose = 10¹¹ neutrons 1‐year‐equivalent γ‐rays dose = 100 Gy • 4Gbps optical transceivers (850nm) • AVAGO (AFBR‐57R5APZ): Killed by  300 Gy • FINISAR (FTLF8524P2BNV): Killed by  300 Gy • Voltage Regulators • LT1963: Killed by  7 kGy MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  12. Analogue/Digital Converters • 40Msps - Parallel ADC • AD9269: Analog Devices Dual 16-bit ADC • LTC2181: Linear Tech.Dual 16-bit ADC • 40Msps - Serial ADC • LTC2264: Linear Tech.Dual 14-bit ADC, serial LVDS • ADS6242: Texas Inst. Dual 14-bit ADC, serial LVDS MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  13. Digital Components • Low Voltage Buffers • 74VCX162244: Fairchild 16-bit Buffer/Line Driver • 74ALVCH162244: Texas 16-bit Buffer/Line Driver • 74VCX162827: Fairchild 20-bit Buffer/Line Driver • LVDS Buffers • FIN1108: Fairchild 8-port LVDS Repeater MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  14. Irradiation Tests • Tests of analogue components (CNRAD) • Installation of a test board during next technical stop (Nov. 7, 2011) • Irradiation tests in 2011 and beginning 2012 • Tests of A/D components (CNRAD) • Installation of a test board in March 2012 • Tests of Functional Prototype (CNRAD) • Installation of a board in June 2012 MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

  15. Project Development Plan • Hardware Production and Test • Final prototype tests (2012) • Series production (2013) • Qualification and test of the series (2013-2014) • Hardware Installation (end 2013 – mid 2014) MOPOS Radiation Tests - JL Gonzalez - 4.10.2011

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