1 / 7

The X-Ray SEF

The X-Ray SEF. Scott Speakman 13-4009A x3-6887 speakman@mit.edu http://prism.mit.edu/xray. What Can You Do with XRD?. Identify and Quantify Phase Composition. Rutile: P4 2 /mnm high temperature polymorph white pigment, sunscreen, UV-blocking coatings, photovoltaic. TiO 2 - Rutile

pelham
Télécharger la présentation

The X-Ray SEF

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. The X-Ray SEF Scott Speakman 13-4009A x3-6887 speakman@mit.edu http://prism.mit.edu/xray

  2. What Can You Do with XRD? Identify and Quantify Phase Composition Rutile: P42/mnm high temperature polymorph white pigment, sunscreen, UV-blocking coatings, photovoltaic TiO2- Rutile TiO2- Anatase TiO2- Brookite Anatase: I41/amd semiconductor, photocatalyst, antimicrobial coating, oxygen sensor Brookite: Pcab no known use

  3. Other Things to Do with XRD Data • Measure Unit Cell Lattice Parameters • Estimate Crystallite Size and Microstrain • Measure Residual Stress (macrostrain) • Measure Texture or Epitaxy • Evaluate Thin Film Quality • Determine Crystal Orientation • Determine Crystal Structure

  4. Diffraction Techniques Availableat the CMSE • X-Ray Powder Diffraction (XRPD) • Grazing Incidence Angle Diffraction (GIXD) • Pole Figure Mapping • Microdiffraction (mXRD) • Residual Stress Mapping • In situ XRD from 11K to 1473 K • Reciprocal Space Mapping • Single Crystal Diffraction (SCD) • Back-Reflection Laue • X-Ray Reflectivity (XRR) • Small Angle X-Ray Scattering (SAXS)

  5. Getting Access to XRD • Training for Self-Use Requires • 1 hour X-ray Safety Course from EHS • 1 hour Lab Specific Safety Training • 2 hr Instrument Specific Training • 2 hr Practical XRD Lecture • next session: June 21, 10 am to 5 pm

  6. Getting Access to XRD • Also Recommended for Self-Users: • Basic XRD Data Analysis using Jade software • 1:30 to 4 pm on June 26 or June 27 • additional dates scheduled according to demand • Assisted Use is also Available • usually needs to be scheduled ~2 weeks in advance

  7. Contact Information • Scott Speakman • office: 13-4009A • x3-6887 • speakman@mit.edu • generally available 10 am to 4 pm M, T, Th, F • XRD Lab: 13-4027 • XRD Computer Room: 13-4041 http://prism.mit.edu/xray

More Related