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Dressing Test for the LHCb Muon MWP Chambers

Dressing Test for the LHCb Muon MWP Chambers

Dressing Test for the LHCb Muon MWP Chambers. LECC 2006 Valencia Speaker: Rafael Antunes Nobrega (INFN Roma1) INFN Roma1: V. Bocci , R. Nobrega INFN Roma2: G. Carboni, A. Massafferri, E. Santovetti. Indice. Chamber & Front-end Electronics Threshold Characteristics Test Setup

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326 views • 22 slides
Dressing Test for the LHCb Muon MWP Chambers

Dressing Test for the LHCb Muon MWP Chambers

Dressing Test for the LHCb Muon MWP Chambers. LECC 2006 Valencia Speaker: Rafael Antunes Nobrega (INFN Roma1) INFN Roma1: V. Bocci , R. Nobrega INFN Roma2: G. Carboni, A. Massafferri, E. Santovetti. Indice. Chamber & Front-end Electronics Threshold Characteristics Test Setup

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230 views • 22 slides

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183 views • 18 slides
Threshold uniformity

Threshold uniformity

Threshold uniformity. ASDBLR2000. ASDQ. Nov 2001 lot of 80 tested chips Upenn test measurements. NIKHEF test measurements of COT testboard. Threshold linearity. ASDBLR99. ASDQ. ASDBLR2000. Noise. ASDBLR99. ASDQ. Noise freq at C=0 pF. http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf.

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169 views • 5 slides
Threshold uniformity

Threshold uniformity

Threshold uniformity. ASDBLR2000. ASDQ. Nov 2001 lot of 80 tested chips Upenn test measurements. NIKHEF test measurements of COT testboard. Threshold linearity. ASDBLR99. ASDQ. ASDBLR2000. Noise. ASDBLR99. ASDQ. Noise freq at C=0 pF. http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf.

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67 views • 5 slides

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