'Aberration correction' diaporamas de présentation

This work supported by the Director, Office of Science, Office of Basic Energy Sciences,

NNI Interagency Workshop January 27-29, 2004 Instrumentation and Metrology for Nanotechnology Grand Challenge Workshop National Institute of Standards and Technology, Gaithersburg, MD. Track 1- Instrumentation and Metrology for Nanocharacterization. Breakout Session: Current State of the Art.

641 views • 51 slides

Direct imaging and parallel-beam diffraction in an aberration-corrected STEM

Direct imaging and parallel-beam diffraction in an aberration-corrected STEM. Ondrej L. Krivanek Nion Co., www.nion.com in collaboration with Niklas Dellby, Neil Bacon, George Corbin, Petr Hrncirik, Nathan Kurz, Tracy Lovejoy, Matt Murfitt, Chris Own*, Gwyn Skone and Zoltan Szilagyi,

908 views • 33 slides

Transmission Electron Microscopy

1.22k views • 26 slides

Transmission Electron Microscopy

651 views • 26 slides

3D STEM Imaging

3D STEM Imaging. EM Technologies and prospective issues in 3D STEM imaging. Research Presentation, The University of Tennessee, Knoxville. by Muharrem Mercimek 7 Feb. 2007. About this Presentation. Need for nano-imaging Atomic material cauterization benefits. SEM, TEM, and STEM

227 views • 22 slides

Transmission Electron Aberration-free Microscope (TEAM) Project

220 views • 20 slides