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VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 31, 2012, 4:00-5:00PM. Contents.

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315 views • 29 slides
VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

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919 views • 28 slides
Design for Testability Theory and Practice Lecture 11: BIST

Design for Testability Theory and Practice Lecture 11: BIST

Design for Testability Theory and Practice Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

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469 views • 28 slides
Testing Analog & Digital Products Lecture 11: BIST

Testing Analog & Digital Products Lecture 11: BIST

Testing Analog & Digital Products Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

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299 views • 28 slides
VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

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408 views • 28 slides
Lecture 21alt BIST -- Built-In Self-Test (Alternative to Lectures 25, 26 and 27)

Lecture 21alt BIST -- Built-In Self-Test (Alternative to Lectures 25, 26 and 27)

Lecture 21alt BIST -- Built-In Self-Test (Alternative to Lectures 25, 26 and 27). Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

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330 views • 28 slides
VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 26, 2013, 2:30-3:30PM. Contents.

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487 views • 26 slides

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