'Defect tolerance' diaporamas de présentation

CS184b: Computer Architecture (Abstractions and Optimizations)

CS184b: Computer Architecture (Abstractions and Optimizations). Day 17: May 9, 2005 Defect and Fault Tolerance. Today. Defect and Fault Tolerance Problem Defect Tolerance Fault Tolerance. Motivation: Probabilities. Given: N objects P yield probability

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Mahim Mishra and Seth C. Goldstein Carnegie Mellon University

International Test Conference Charlotte, NC, Sep 30-Oct 2, 2003 Defect Tolerance at the End of the Roadmap. Mahim Mishra and Seth C. Goldstein Carnegie Mellon University. Purpose. Future technologies: EUV Lithography and Chemically Assembled Electronic Nanotechnology

672 views • 55 slides

FPGA Defect Tolerance: Impact of Granularity

FPGA Defect Tolerance: Impact of Granularity. Anthony Yu Guy Lemieux December 14, 2005. Outline. Introduction and motivation Previous works New architectures Coarse-grain redundancy (CGR) Fine-grain redundancy (FGR) Experimentation Results Conclusions. Introduction and Motivation.

483 views • 35 slides

Anthony J. Yu Guy G.F. Lemieux August 25, 2005

Defect-tolerant FPGA Switch Block and Connection Block with Fine-grain Redundancy for Yield Enhancement. Anthony J. Yu Guy G.F. Lemieux August 25, 2005. Outline. Introduction and Motivation Previous Approaches Fine-grain Redundancy Results Conclusions. Introduction and Motivation.

421 views • 28 slides

ELE 523E COMPUTATIONAL NANOELECTRONICS

Mustafa Altun Electronics & Communication Engineering Istanbul Technical University Web: http://www.ecc.itu.edu.tr/. ELE 523E COMPUTATIONAL NANOELECTRONICS. W7-W8:Defects and Reliability, 11/11/2013-18/11/2013. FALL 2013. Outline. Defects in nanoscale Permanent defects

401 views • 27 slides

Array-Based Architecture for FET-Based, Nanoscale Electronics

388 views • 26 slides

Switch-based Boolean computation

364 views • 26 slides

A Pageable Defect Tolerant Nanoscale Memory System

A Pageable Defect Tolerant Nanoscale Memory System. Susmit Biswas, Tzvetan S. Metodi, Frederic T. Chong, Ryan Kastner susmit@cs.ucsb.edu. Problem Statement. In a nanoscale memory system with high manufacturing defect rate , we aim to find a scheme with low static and dynamic overhead

318 views • 22 slides