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Hyper-Spectral Imaging with Image Slicers

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Improving wave model validation based on RMSE

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Thin Edgeless Silicon Pixel Sensors on Epitaxial Wafers after Irradiation

Thin Edgeless Silicon Pixel Sensors on Epitaxial Wafers after Irradiation. M. Boscardin a , L. Bosisio b,c , G. Contin b,c *, G. Giacomini a , V. Manzari d , G. Orzan c , P. Riedler e , I. Rashevskaya c , S. Ronchin a , N. Zorzi a a FBK , Trento, Italy

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Summary of H3XX standard characteristics

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Reactor antineutrinos in the world

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Typical chromophore conversion efficiency for BR-IX: h -1 = 15%

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Figure 1

CNMS User Program Highlight. Topographic and Spectroscopic Characterization of Electronic Edge States in CVD Grown Graphene Nanoribbons Minghu Pan, 1 E. Costa Gira?o, 2,7,8 Xiaoting Jia, 4 Sreekar Bhaviripudi, 4 Qing Li, 1 Jing Kong, 5 V . Meunier, 2,3 and Mildred S. Dresselhaus 5,6

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