'Negative bias temperature instability' diaporamas de présentation

( i.e. , A brief history of sand)

794 views • 55 slides

VLSI Design Lecture 4-a: Layout Extraction

614 views • 35 slides

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES. Fault Modeling. Overview. Motivation Fault Modeling Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Transistor faults Summary. Motivation. Models are often easier to work with

361 views • 21 slides

Reliability Enhancement via Sleep Transistors

Reliability Enhancement via Sleep Transistors. Frank Sill Torres + , Claas Cornelius*, Dirk Timmermann* + Department of Electronic Engineering, Federal University of Minas Gerais, Belo Horizonte, Brazil

309 views • 20 slides

Process & Product checks

Test. Process & Product checks. Introduction. Scope Testing (quality control) is done at various steps Our focus: Only electrical tests Other tests: Defectivity test, etc Electrical Testing Process check (Only overall condition) PARAMETRIC or E-Test

244 views • 15 slides