'Peaking time' diaporamas de présentation

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Beam test results of a prototype sensor for the Belle SVD upgrade

Beam test results of a prototype sensor for the Belle SVD upgrade. 31 October 2006 Nobuhiro Tani for Belle SVD group. The Belle SVD Group. SVD Group Frankfurt U., U. Hawaii, Jozef Stefan Inst., Kanagawa U., KEK, Krakow INP, U. Melbourne,

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NA62 front end Layout in DM option

NA62 front end Layout in DM option. Jan Kaplon/Pierre Jarron. Architecture. Preamp; buffered cascode (NMOS input transistor), resistive feedback (200k) Gain;70mV/ fC (25mV/ fC at preamp output) Preamplifier AC coupled to shaper and discriminator stages

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A General Purpose Charge Readout Chip for TPC Applications

A General Purpose Charge Readout Chip for TPC Applications Luciano Musa, CERN, 10 th September 2007. Outline Introduction Circuit overview and architecture Charge amplifier prototype in 0.13mm CMOS New programmable charge amplifier for LPTPC. Digital Circuit.

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APV25 noise evaluation

APV25 noise evaluation. 2005/12/07 SVD upgrade meeting S.Ono(TIT). Noise from detector capacitance Noise from leak current. APV Noise measurement peaking time: Tp=35ns~200ns APV chip bonded to only pitch adaptor -> C D , I leak are very small. Shaping curve. Tp=50ns.

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