'Technology policy research' diaporamas de présentation

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Patent Overlay Mapping: Visualizing Technological Distance

Patent Overlay Mapping: Visualizing Technological Distance. Luciano Kay, Center for Nanotechnology in Society, University of California Santa Barbara, Santa Barbara, CA 93106-2150, e-mail: luciano@cns.ucsb.edu Nils Newman, Intelligent Information Services Corporation, e-mail: newman@iisco.com

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