'Test application time' diaporamas de présentation

Reducing Test Application Time Through Test Data Mutation Encoding

Reducing Test Application Time Through Test Data Mutation Encoding. Sherief Reda and Alex Orailoglu. Computer Science Engineering Dept. University of California, San Diego. Outline. Introduction. Motivation. Test Data Mutation Encoding. Scheme overview. Overlap exploration.

593 views • 45 slides

Controlled Transition Density Based Power constrained Scan-BIST with Reduced Test Time

322 views • 32 slides

Test Data Compression for Scan-Based Testing

Test Data Compression for Scan-Based Testing. Presented by Mustafa Imran Ali Research Assistant COE. Presentation Outline. Issue/Motivation Necessary Background Existing Approaches Proposed Approach. The Issue: Test Data Volume.

385 views • 30 slides

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Vishwani D. Agrawal Agere Systems Processor Architectures and Compilers Research Murray Hill, NJ 07974 va@agere.com http://cm.bell-labs.com/cm/cs/who/va January 16, 2002. MEANING OF DELAY TEST. V1 V2. Transient region. Inputs.

138 views • 13 slides