'Test circuits' diaporamas de présentation

Mahim Mishra and Seth C. Goldstein Carnegie Mellon University

International Test Conference Charlotte, NC, Sep 30-Oct 2, 2003 Defect Tolerance at the End of the Roadmap. Mahim Mishra and Seth C. Goldstein Carnegie Mellon University. Purpose. Future technologies: EUV Lithography and Chemically Assembled Electronic Nanotechnology

675 views • 55 slides

ECE 477 Design Review Team 4 ? Spring 2006

ECE 477 Design Review Team 4 ? Spring 2006. Justin Thacker, Matt Kocsis, Ian Snyder, Dustin Poe. Outline. Project overview Project-specific success criteria Block diagram Component selection rationale Packaging design Schematic and theory of operation PCB layout

351 views • 27 slides

INTRODUCTION

EFFECTS OF CIRCUIT SIMULATION ON ACHIEVEMENT OF TECHNICAL COLLEGE ELECTRONIC STUDENTS By Akor Stephen & T. C. Ogbuanya. INTRODUCTION.

267 views • 20 slides

Preliminary Design Review (PDR)

134 views • 10 slides