'Transient data read errors' diaporamas de présentation

SEE and TID Extension Testing of the Xilinx XQR18V04 4Mbit Radiation Hardened Configuration PROM

SEE and TID Extension Testing of the Xilinx XQR18V04 4Mbit Radiation Hardened Configuration PROM. Authors Carl Camichael (Xilinx, Inc.) Joe Fabula (Xilinx, Inc.) Gary Swift (Jet Propulsion Laboratory) Steve Guertin (Jet Propulsion Laboratory) Candice Yui (Jet Propulsion Laboratory).

331 views • 20 slides