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Designing a Robust Four-Point and Hot-Point Probe

Designing a Robust Four-Point and Hot-Point Probe. Shawn Adderly and Arica Inglis ECE 445 Group 5 December 2, 2010. Introduction. ECE 444 Fabrication Lab Four-Point Probe Measures sheet resistance and bulk resistivity for use in silicon wafer testing

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Designing a Robust Four-Point and Hot-Point Probe