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STIL Support

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  1. STIL Support IMS Design and Test Software, Oct 2002

  2. SOC Device Tests Supported Today • Functional tests • Digital patterns from Verilog testbenches like VCS • Analog tests are “handcrafted” by test department • Structural tests • Scan based (TetraMAX Output) • Iddq • Digital (SoCBIST), Memory, Mixed-Signal BIST

  3. IMS Short Term STIL Strategy • Support STIL input for DFT flows • Full Language parser • DFT data subset in practice • CTL supported • Input from all DFT tools • Validate STIL output to 1450 spec standard • Support ATE-specific variants

  4. Functional (VCS) VCD Cyclize Tester Bridge Test PGM Data base Structural (TetraMAX) WGLSTIL TESTDEBUG TESTDEVELOPMENT DESIGN The IMS TestDeveloper Flow • Design simulation output must be timed and ATE optimized • Structural and functional tests are combined into one test file • A “Bridge” creates specific tester source data IMS flow simplifies complex tasks Standardized process shortens test development time Supplements in-house resources

  5. Advanced Test DevelopmentTestDeveloper™ Test Debug on the DesktopVirtualTester™ • Ando • Advantest T33xx, T66xx, T65xx • Agilent 83000, 93000, 94000 • Credence SC, Duo/Quartet/Octet • Teradyne J750, J971/3, A5, Catalyst, Tiger • IMS ATS, XTS, FT, Vanguard • NPTest ITS9000 • LTX • SZ Test Systeme M3610, M3650, Piranha, Falcon, Kodiak Supported ATE Product Families And Additional Tester Support in Development • Advantest T3340, T6600 • Agilent 83000, 93000 • Credence Kalos & Quartet/Octet • Teradyne J750, J971/3, Catalyst/Tiger • Versatest V1000, V1300 • IMS Vanguard • NPTest ITS9000 • SZ Test Systeme M3650, Piranha, Falcon, Kodiak

  6. STIL Test Construct Advantages • Flexible Signal group and attribute definition • Hierarchical and multi-track waveform tables • Spec block & Selector block specifies min/typ/max, etc. • Print-on-change pattern data • Compact pattern data character representation • MatchLoop, BreakPoint, GoTo, IddqTestPoint support • Pattern Exec & Control block to select from multiple timing and waveform blocks • Scan Structure efficiency using Procedures and Macros • User-defined extensibility; User Keywords & User Functions

  7. In Summary • TestDeveloper delivers the flow to enable the current STIL efforts to be productive • TestDeveloper supports the complete (functional and structural) test pattern, timing and connectivity files for engineering and production test systems • IMS DaTS will continue its involvement in the STIL standards efforts

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