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Leading Manufacturer of (G)MR Head Test Equipment Since 1995 PowerPoint Presentation
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Leading Manufacturer of (G)MR Head Test Equipment Since 1995

Leading Manufacturer of (G)MR Head Test Equipment Since 1995

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Leading Manufacturer of (G)MR Head Test Equipment Since 1995

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  1. Leading Manufacturer of (G)MR Head Test Equipment Since 1995 3000 Olcott St. Santa Clara, CA 95131 Tel: 408 941-8300 E-Mail: sales@us-isi.com Web: www.us-isi.com

  2. ISI Confidential

  3. Topics • Introduction to ISI • ISI Technology and Test Capabilities • Product Suite ISI Confidential

  4. Corporate Headquarters Santa Clara, California 17,500 Sq.Ft. Total 7,500 Sq.Ft R&D 10,000 Sq.Ft. Manufacturing ISI Confidential

  5. MMI Systems PTE LTD in Singapore is ISI’s Manufacturing Partner • The MMI Group is a publicly-held company in Singapore providing Contract Manufacturing Services in the form of Precision Engineering Components, Factory Automation Equipment, Electronics (PCB Assembly), Electro-mechanical assembly of Intermediate and Finished products. • Industries covered includes Data Storage, Telecommunications, Computer Peripherals, Optics, Photonics and Semiconductor Equipment. ISI Confidential

  6. MMI Systems: Kaki Bukit, Singapore 370+ Personnel 100 000 sq.ft. Dedicated to Equipment CM and Automation Main Office/ Assembly Areas Components Precision Machining Design Development / Prototype Area/ Assembly Areas ISI Confidential

  7. MMI Class 10K Assembly Area ISI Assembly Final Test Area ISI Confidential

  8. Fujitsu Hitachi GST HnT Samsung Headway Teleplan Western Digital Seagate SFIT TDK/SAE Toshiba Sony Sun Microsystems ISI Customers ISI Confidential

  9. ISI Production Installed Base Major Customer A Major Customer B • OVER 600+ QST-2002 HSA Production Testers • OVER 250+ Blazer-X5B Row Production Testers • Multiple Engineering F/A and Reliability Systems ISI Confidential

  10. World Wide Support • USA – Integral Solutions Int’l • Malaysia – Integral Solutions Int’l • Thailand – Integral Solutions Int’l • Philippines – Integral Solutions Int’l • Japan – Xyratex Japan • Singapore – WesTech • China – WesTech • Korea – Bay Solutions ISI Confidential

  11. ISI QST Tester in a Nutshell QST test equipment for Wafer, Row, Slider, HGA, HSA, and HDD test applications, using a common electronics/software platform: • Static Tests Voice coil, Shorts, Fault Detection, ... • Low Frequency Measurements Transfer Curve, Amplitude, Resistance, ... • High Frequency Measurements SMAN, SMAN II, AC Noise, Popcorn, FFT, ... ISI Confidential

  12. Low Frequency Measurements Measures head resistance change versus an externally applied magnetic field through a low frequency channel. The following Low Frequency tests can be performed. • Resistance • Transfer curve • Stability • Bias angle • Asymmetry sweep • Resistance delta ISI Confidential

  13. Transverse Transfer Curve ISI Confidential

  14. Static Tests (HSA / HDA) As an optional plug-in board for HSA/HDA test applications, verification of the Preamp Chip, Flex, and Voice Coil assembly can be performed. • Voice coil measurements • Fault detection • Current consumption • Pin-Pin and Pin-Ground shorts • Temperature Sensor control • Passive component measurements • RDX / RDY offset voltage ISI Confidential

  15. High Frequency Measurements Measures high frequency read sensor noise as influenced by write, field, temperature, ESD stress, or combinations of those stresses. The following High Frequency tests can be performed • SMAN and SMAN II • FFT Frequency Response • Glitch After Write (Popcorn /w digitizer) and simultaneous field sweep • AC Noise Test • W/R Recovery (/w digitizer) ISI Confidential

  16. High Frequency Channel Technology • 200 Mhz Analog Bandwidth • 160 Mhz 10-bit digitizer • Real-Time 250 uS Memory per cycle /w pre-trigger • Simulates HDD HF Channel (measures from Rdx/Rdy) • Smart Threshold Trigger for Digitizer • Very Low Noise Channel • W/R Recovery < 500 ns • 12.5 – 400 Mhz Write Frequency • Programmable Last Edge Polarity • 2 User Selectable Filters (High-Pass freq defined by customer) • Low Cut-Off Frequency 1-3 Mhz (defined by customer) ISI Confidential

  17. Field Induced Instability Soft Kink at 160 Oe ISI Confidential

  18. Field Induced Instability @ 150 Oe ISI Confidential

  19. Field Induced Instability @160 Oe ISI Confidential

  20. Field Induced Instability @ 170 Oe ISI Confidential

  21. Spectral Maximum Amplitude Noise (SMAN) Test Soft Kink at 160 Oe ISI Confidential Patent: US6943545

  22. Digitizer is The Key to S.M.A.N. • Qualifies Three Types of Instability Events in One Second Test • RMS Noise for broadband noise • Max Amp for rare events such as Barkh. Jumps and Write Induced Instability • Amp Noise for high probability noise ISI Confidential

  23. Popcorn/AC Noise tests vs. SMAN • Popcorn/AC noise set a threshold and count pulses exceeding the threshold • Result is a count i.e. 10 or 10,000 Not enough information and not repeatable enough for pass/fail • SMAN digitizes all pulses and gets noise amplitude in uV. Results are repeatable within 15% Allows prediction of drive level performance. Screens out heads that will cause high BER or loss of servo. ISI Confidential

  24. Spectrum Analysis ISI Confidential

  25. Product Suite • SLIDER FAB • HEAD FAB • RELIABILITY • ESD ISI Confidential

  26. Slider Fab Testers • Blazer-X5B Row/Bar Level • Blazer-X5S Slider Level • DSI-3000 Device Sorter Inspection ISI Confidential

  27. Blazer-X5B Row/Bar Level Analyzer ISI Confidential

  28. Blazer-X5S Slider Level Analyzer ISI Confidential

  29. Blazer-X5 Platform Electronics • Uses QST-2002E for all measurements • Dual LF simultaneous measurement channels • Pad miss-contact detection • Four point resistance measurement • Up/Down slider selection with single Probe Card • Writer resistance measurement • Contacts grounded during probing • Selectable gain channels • Programmable diode clamping • High Field Intensity +/- 1350 Oe • Field Resolution 0.165 Oe • L-Field < 2% • Field Uniformity 2% ISI Confidential

  30. Blazer-X5 System Features • Supports Pico and Femto devices • Compact footprint • Automated device handling • Uses process trays as test trays • Bar Sizes 30-100 mm • Minimum Pad Size 80uM • Missing device detection • Compact Probe Card (2”x3”) • 8 Point Probe Card, 2 sets • Probe contacts both writer and reader • Simple Probe Card Alignment without tools • Active slider pickup nozzle • OCR option ISI Confidential

  31. DSI-3000 Device Sorter Inspection ISI Confidential

  32. DSI-3000 Features • Input: Up to 2 user defined de-bond trays or 10 standard 2x2 Waffle Trays* • Output: Up to 20 standard 2x2” Waffle Trays* • Slider not flat in output tray:...............<0.5% • Unable to pick up slider:....................<0.5% • Sliders dropped:.................................<0.01% • Sliders lost:.........................................0% • Uptime:...............................................>98% • Semi-Auto Nozzle Verification:...........Yes • Semi-Auto Nozzle Calibration:...........Yes • 1, 4 or 9 Point tray calibration:...........Yes • ESD Safe:...........................................Yes • Application Dependent* • UPH (Femto/Pemto w/ OCR):............2500 • Unread OCR:......................................<0.1% • Mis-Read OCR:..................................<0.05%*Note: Input/Output side is user defined ISI Confidential

  33. Head Fab Products • QST-2002 table top unit • Universal tooling interface • Available toolings for HGAs, HSAs, HDAs • Optional magnet configurations • QST-2002HF ISI Confidential

  34. QST-2002 SYSTEM ISI Confidential

  35. QST-2002 Toolings HGA HSA HDA Tape 8x HGA ISI Confidential

  36. Optional Magnet Configurations High Field Magnet Side Field Magnet ISI Confidential

  37. QST-2002 Technical Features • Low Noise < 20 uV Pk-Pk • Dual DC Channel • High Accuracy/Repeatability • Adjustable Field Angle 360° • High Field Intensity +/- 1000 Oe • Uniform Field < 1% • High Write Current • Open Architecture Software ISI Confidential

  38. QST-2002HF High Field QST System ISI Confidential

  39. QST-2002HF Technical Features • +/- 15,000 Oe Field • Blazer-X5 Platform • Air Cooled Magnet • Support standard AC Channel Analysis • 0-90 Deg Rotation • Standard 2x HGA Tooling Support ISI Confidential

  40. Sample Test Plots Transverse Transfer Curve Longitudinal Transfer Curve ISI Confidential

  41. Thermal Reliability Products • Blazer-X5L Row/Bar Level Lifecycle tester • QST-2002 /w 8x Temperature Control Module • QST-2002RT /w 12x Temperature Control Module ISI Confidential

  42. Blazer-X5L Row/Bar Lifecycle Tester ISI Confidential Patent: US6943546

  43. Blazer-X5L Electrical Features • Temperature up to 100° C with <1° C Accuracy • Bias Current/Voltage selectable • Tests up to 96 elements at a time • Writer Stress capable • 200 Mhz AC Channel capable • Uses QST-2002E for all measurements ISI Confidential

  44. QST-2002 /w 1x and 8x Temp Control Module QST-2002 with 8x Tooling QST-2002 with 1x Tooling ISI Confidential

  45. QST-2002 /w Temp. Control Module • Unique 1x and 8x Head Hot Plate Design • Max Temperature 250° C • 1° C Temperature Accuracy • .01° C Temperature Stability • 8x Cartridge Design • Independent Bias current/voltage control for all heads ISI Confidential

  46. 1x and 8x Hot/Cold Test System 1x Hot Cold Plate on Gen2 2x Platform ISI Confidential

  47. QST-2002 with Hot/Cold Module • Unique 1x and 8x Head Hot Plate Design • Temperature 5-120° C • 1° C Temperature Accuracy • Cartridge Design • Independent Bias current/voltage control for all heads ISI Confidential

  48. QST-2002RT /w 12x Temp Control Module Hot Only Option Hot/Cold Option /w Humidity Control ISI Confidential

  49. QST-2002RT • Temp Range (Hot-Only):......ambient to 250° C • Temp Range (Hot/Cold):..............-20° to 80° C • Humidity Control:................Yes (Hot/Cold only) • Accuracy:......................................................5% • Stability:..................................................0.25° C • Control:...........................................Closed Loop • Gen3 2xBar Electronics Front-end • Dual 6xHGA Cartridges • HGA Cartridges customizable for different head types and configurations • Offline HGA mounting • Simultaneous Electrical Stress with Temperature • Electrical Stress includes any combination of Bias, Bias Pulsing, Write, DFH, or Field Stress • Full LF and HF measurement capability with short interconnections ISI Confidential

  50. QST-2002 /w Temp. Control Test Results Temperature Test Transfer Curve ISI Confidential