Measuring Noise and Performance in Cooling Circuitry for Electronics Testing
This presentation by Leon Mualem from the University of Minnesota discusses the challenges and solutions in testing cooling circuitry for electronics, specifically focusing on Active Pixel Detectors (APD). Key topics include noise measurements at Fermilab with newly designed boards, fixes implemented to reduce noise levels, and expected improvements in performance. Additionally, it outlines future plans for comprehensive noise testing under various conditions and the integration of different components to enhance sensitivity and reliability.
Measuring Noise and Performance in Cooling Circuitry for Electronics Testing
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Presentation Transcript
APD and Electronics Testing Leon Mualem Univ. of Minnesota October 2, 2003
Fix Some Issues on Rev. A Bypassing on Vref and Vcc Higher Value Resistors Filter on voltage Regulator
Initial Noise msmt at FNAL with new board • MASDA noise best case expected 330 e- • 15 Channels with reduced noise after fixes. • 4 @ 390e- • 6 @ 420e- • 3 @ 450e- • 2 @ 480e- • Reminder: This is an interim solution, a properly matched front end should get ~250e- according to Tom Zimmerman 18 Meg Ohms 9 Meg Ohms
Noise testing parameters • Maximum bandwidth setting • 21mV/fC gain 300e-/mV • 1mV=1ADC count • Integration Time (SAFT-SBEF) = 2s
Noise Levels on Bare Board W/10pF W/18M W/9M
Issues … • Cooler plate must not be left floating • Electrically connect to board
Future Plans • Measure noise with powered APD • Measure noise with APD vs. Temperature • Gain measurement with Temperature • Measure noise as a function of Tint • Measure LED generated signal • Measure signal from scintillator with trigger • …