1 / 5

APV25 noise evaluation

APV25 noise evaluation. 2005/12/07 SVD upgrade meeting S.Ono(TIT). Noise from detector capacitance Noise from leak current. APV Noise measurement peaking time: Tp=35ns~200ns APV chip bonded to only pitch adaptor -> C D , I leak are very small. Shaping curve. Tp=50ns.

brett-stevenson
Télécharger la présentation

APV25 noise evaluation

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. APV25 noise evaluation 2005/12/07 SVD upgrade meeting S.Ono(TIT)

  2. Noise from detector capacitance Noise from leak current • APV Noise measurement peaking time: Tp=35ns~200ns • APV chip bonded to only pitchadaptor -> CD, Ileak are very small

  3. Shaping curve Tp=50ns Tp=100ns Tp=150ns Tp=200ns Fitting function:

  4. Noise vs. peaking time Noise: averaged each chip Peaking time: calculated from fitting 1 ADC count ~ 200 electrons Chip 1 Chip 2 Chip 3 Chip 4

  5. summary • Noise have decreased with peaking time rising (decreasing is very small because of small capacitance) • Leak current flowed little, so shot noise were small and APV noise have not increased at long peaking time

More Related