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Advanced Data Management with PANELMAP: Transforming Flat Panel Geometry Analysis

PANELMAP provides cutting-edge technology for managing and analyzing flat panel measurements. It enables users to collect, edit, visualize, and analyze critical physical parameters from various devices, including ellipsometers, 4-point probes, and thickness gauges. With 9 visualization options, including 1D to 3D plots, and comprehensive data operations like filtering and statistical process control (SPC), PANELMAP streamlines measurement comparison and trend analysis. The user-friendly XML-based format allows for easy multi-measurement imports, while robust exporting options ensure seamless data sharing.

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Advanced Data Management with PANELMAP: Transforming Flat Panel Geometry Analysis

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  1. Supported File Formats PANELMAP We add customer imports upon request • Transfer of Award winning technology to flat panel geometry • Collect, edit, visualize and analyze measured physical parameters on LCD, TFT, flat panels • Import data from different metrology tools • Ellipsometers • 4 point probes • Thickness gauges

  2. PANELMAP • 9 different visualization plots from 1D to 3D • Data operations and filtering • File comparison • Statistical Process Control SPC • Browser • Trend chart • Inter-application Communication (Active X)

  3. PANELMAP • New easy to use XML-based Boin file format • Multiple panels and multi-measurements in one file • Import of multi-measurement panels at once • Free rotation of 3D plots • Export of *.jpg and *.bmp • Export of *.html • … and many more

  4. PANELMAP • Compare your measurements • Work off-line • Work outside the clean room • PANELMAP is your choice

  5. Thank you very much for your interest in PANELMAP

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