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Detector Monitoring as part of VLT Science and Data Flow Operations. Wolfgang Hummel DMO/DFO/QC group Lander de Bilbao, SDD/pipeline group Andrea Modigliani, SDD/pipeline group Lars Lundin, SDD/pipeline group Paola Amico, LPO/PSO Pascal Ballester, SDD coordinating chair
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Detector Monitoring as part of VLT Science and Data Flow Operations Wolfgang Hummel DMO/DFO/QC group Lander de Bilbao, SDD/pipeline group Andrea Modigliani, SDD/pipeline group Lars Lundin, SDD/pipeline group Paola Amico, LPO/PSO Pascal Ballester, SDD coordinating chair Gaspare LoCurto, LPO/PSO Leonardo Vanzi, LPO/PSO SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringoutline of the talk project purpose calibration plan review methods and algorithm selection quality characteristics iterative recipe tests deployment and commissioning SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringproject purpose There is a unified scheme to monitor optical detectors at the ESO LaSilla observatory A similar scheme should be implemented for the Paranal observatory to improve operations within the VLT dataflow (PSO, QC group, SDD) SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringproject outline review the operational calibration plans for all optical 12 science detectors (FORS1,2 UVES, GIRAFFE, VIMOS) and all 11 near and mid IR science detectors (ISAAC, CONICA, SINFONI, CRIRES, AMBER, MIDI, VISIR) design and implement a detector monitoring plan, and put it in operation. review outcome: Amico, P. et al. 2008, ‘The Detector Monitoring Project’, in ‘The 2007 ESO Instrument Calibration Workshop’ SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringreview outcome priority and frequency of detector related QC parameters: 1. daily: RON and BIAS/DARK level 2. monthly: gain and linearity 3. other: bad pixels, crosstalk, persistence, periodic noise, shutter error, correlatednoise, odd-even column effect, large scale fixed pattern noise, low scale fixed patternnoise, contamination RON, BIAS/DARK is in place with inhomogeneous analysis gain and linearity incomplete -> highest priority start with optical CCDs and near IR, complete for MID IR and interferometric instruments later SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringgainlintemplate design calibration templates must be aligned with data reduction pipeline recipes no template change required for UVES (ccd_test), GIRAFFE and SINFONI. template upgrade required for FORS1/2, ISAAC, NACO (flat pairs instead of single flats and include BIAS frames). new template for VIMOS, CRIRES SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringtools selection ESO common pipeline library (CPL) two versions: optical CCD, near IR arrays linearity: polynomial, inverse via Newton-Raphson (+ FPN, +opt contamination, +nir bad pixel map), an OPT and a NIR version required. gain: photon transfer curve and inter-pixel capacitance correction ron: 4 methods (incl. pre+over scan) bias (median) SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringgainlinrecipe tests I one recipe tested for all detectors on (partially interleaved) frame stacks. a) handle conventional fits frames and multi-detector frames with fits extensions (CRIRES, UVES). b) configurable confinement of the analysis region to handle vignetting (FORS, NACO, CRIRES) c) upper threshold for signal level (saturation, non-linearity regime) d) flux alignment of consecutive flat pairs SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringrecipe tests II • FORS2 lower mosaic CCD: • saturation and vignetting • - both chips in two single fits frames UVES red arm CCD: both chips intwo extensions of one fits frame • confined analysis region • option to handle fits extensions • upper flux threshold option SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringrecipe tests III SINFONI: integral field spectrograph: No imaging flats possible. Regular pattern of 32 pseudo slits Persistence does not allow for flats of exactly the same flux level SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringrecipe tests V: PTC SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
From Finger, G. et al, 2005 Smear-out effect. A lower gain is measured Detector Monitoringinter-pixel capacitance SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringinter-pixel capacitance giraffe : 1.0009 crires • Measuring gain from PTC via flat difference frames • Inter-pixel capacitance: PSF > 1 pixel -> lower noise, higher gain. • use flat difference frames ?? Fixed pattern noise ?? • - Autocorrelation algorithm Finger, G. et al. 2005 ‘Conversion gain and inter-pixel capacitance …’ SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
flat difference, 2% flux difference flux aligned flat difference bad autocorrelation inter-pixel capacitance PSF good autocorrelation inter-pixel capacitance PSF SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringrecipe tests IV SINFONI: Gain correction: 1.09 SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector Monitoringprojectstatus last slide • detector calibration plan in operation for GIRAFFE, UVES, and SINFONI • other detectors coming soon: VIMOS, ISAAC • project completion expected for the end of 2008 • future science detectors will benefit: HAWK-I (4), VIRCAM/OCAM (16/32 !!!), X-shooter (3), … SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control