Béatrice Pradarelli / Laurent Latorre / Pascal Nouet

1. Industrial Testing Education at Undergraduate Level: A Datasheet and Diagnosis Labs ApproachEWME2010 Béatrice Pradarelli / Laurent Latorre / Pascal Nouet

2. Outline • Introduction to CNFM/CRTC • Labs oriented approach for industrial testing education of undergraduate students • Future Developments

3. CNFM National Comity for Education in Nano and Microelectronics EWME2010

4. Created 25 years ago to answer to the need of sharing high cost equipments (tester, cleaning room, …) for education Sponsored by French government & micro/nano electronic industry 12 CNFM centers strategically located CNFM Network Micro/Nano-electronic industry CNFM centers RENATER Network

5. To share equipments dedicated to IC manufacturing and characterization, prototyping, test of IC and SIP/SOC products and design automation tools To offer dedicated trainings to academic people (students and teachers) To develop collaborations with research labs and companies to promote innovation CNFM Missions

6. CRTC: CNFM Test Resource Center • Public organization, created in 1998, specialized in the test of microelectronic products. Located in Montpellier, south of FRANCE. • Owner of an industrial tester, the Verigy V93K PinScale: • Used for Education at undergraduate and L, M, D levels. • Used for test engineering services (test time, support, consulting) to companies & research labs • Accessible from anywhere

7. INDUSTRIAL TESTING EDUCATION AT UNDERGRADUATE LEVEL EWME2010

8. ICs testing in Mass production • Millions of parts (ICs) tested automatically daily • Rooms full of test equipments (tester/handler/prober) • Skilled technicians in charge of the overall process

9. CRTC Environment and Network DEVICE UNDER TEST Optical Link

10. Lab Oriented Approach Data Sheet Test Prog. Test Results P F Analysis Diagnosis Device robustness versus design and manufacturing • Pedagogical Objectives • Initiate undergraduate students to industrial testing • Guide them having a better understanding of the interaction between ICs design, manufacturing & test

11. From Data Sheet to Test Program Data Sheet • Block diagram • Pinning • Operating conditions • Truth table • DC characteristics • AC characteristics Test Program • Test conditions: T (°C), Vcc • Functional test • Parametric tests: Vil/Vih/Vol/Voh and leakage measurements • Timing tests: propagation delay, set up and hold times measurements START Fonctional Test Continuity Test DC Test AC Test Test Program

12. Test Results Analysis START Functional Test Continuity Test DC Test AC Test Manufacturing, assembly verification • Industrial test concept • Protection diodes on each pad • ESD damages / wrist strap usage

13. Test Results Analysis START Functional Test Continuity Test DC Test AC Test Pass (Go) Fail (No Go) Fonctional Test @ f1 $$$ Fonctional Test @ f2<f1 $ Device behavior verification • Go/no Go test • Test flow execution order, test strategy, cost of test

14. Test Results Analysis START Functional Test Continuity Test DC Test AC Test margin margin LL UL Electrical and timing parameters verification • Measured values vs data sheet ones • Product characterization: shmoo plots • Product robustness versus process

15. Failing Device SWITCHES MODE DELAY • FPGA approach to insert stuck at/delay faults Good IC Schematic + new lines

16. Diagnosis • Understanding the failures and finding the root cause in the IC using the tester debugger tools • Interaction between Test, Design, Design for Testability (DFT) and process Sa1 S1

17. CRTC test activities and organization offer test services and trainings to academic, research lab and industrial people. Lab oriented approach to initiate undergraduate students to industrial testing in 8 hours deployed since 2008: 50 students attended. Next: develop a new lab using the FPGA platform and addressing the DFT, fault simulations, SCAN test concepts Summary EWME2010