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Activities at IEAP CTU Prague

Activities at IEAP CTU Prague. T. Slavíček, V. Linhart , S. Pospíšil Institute of Experimental and Applied Physics, Czech Technical University in Prague, Czech Republic. Outline. Introduction of IEAP CTU Developement of test setup New test box Laser system developement and test

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Activities at IEAP CTU Prague

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  1. Activities at IEAP CTU Prague T. Slavíček, V. Linhart, S. Pospíšil Institute of Experimental and Applied Physics, Czech Technical University in Prague, Czech Republic

  2. Outline • Introduction of IEAP CTU • Developement of test setup • New test box • Laser system developement and test • IV measurement • Idea of measurement • Results • Conclusion Tomáš Slavíček

  3. Institute of Experimental and Applied Physics • The Institute bases its activity from the following long-term programs: • Fundamental experiments in Physics of the Microworld • Cooperation with CERN • Research Center "Material analysis and characterization by radiation" • Research Center "Astroparticle and Astrophysics experiments" Tomáš Slavíček

  4. New test box Test box is suitable for: • IV, CV • Tests with radiation sources (alphas, MIPs, etc.) • Tests with lasers Characteristic of test box • Shielded box • Inside flow box with supply of clean air Equipped • Cooling system up to -10°C and dry air supply • Set of microprobes Future development • Improvement of cooling system – supply of cold air • Precise positioning system for lasers Tomáš Slavíček

  5. Si red infra Pulse laser system Light attenuation Intensity attenuated to 1/e in Si: 660 nm ... 3mm 1060 nm ... 3mm • wave lengths • 660 nm (red) • 1060 nm (infra-red) • pulse length ~2 ns (FWHM) • can generate energy equivalent up to ~MeV • current preamps Phillips Scientific (bandwidth 1GHz) • current signals sampled with a digital scope (10 Gs/s, bandwidth 1GHz) a equivalent MIP equivalent Tomáš Slavíček

  6. Results from laser system Tomáš Slavíček

  7. IV measurement • Plan of measurement • IV at 20C, 0C & -10C before annealing • Annealing performed by leaving the samples at room temperature for a week • during annealing repeat measurements every 2-3 days • Used instruments • Precise current-meter KIETHLEY 6517a and bias driver KEITHLEY 2410 • Microprobes SUSS PH100 • Measurement settings • Step = 1 V, delay = 2 s X => tested samples Tomáš Slavíček

  8. Results – IV of 3E and 4E NI sample Tomáš Slavíček

  9. 2E 5e15 – I vs time of annealing @ different temperatures Tomáš Slavíček

  10. 2E 1e16 – I vs time of annealing @ different temperatures Tomáš Slavíček

  11. 3E 1e15 – I vs time of annealing @ different temperatures Tomáš Slavíček

  12. 3E 5e15 – I vs time of annealing @ different temperatures Tomáš Slavíček

  13. 3E 1e16 – I vs time of annealing @ different temperatures Tomáš Slavíček

  14. 4E 1e15 – I vs time of annealing @ different temperatures Tomáš Slavíček

  15. 4E 5e15 – I vs time of annealing @ different temperatures Tomáš Slavíček

  16. 4E 1e16 – I vs time of annealing @ different temperatures Tomáš Slavíček

  17. Conclusion • … • … Tomáš Slavíček

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