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Enhancing Focal Plane Electronics with Digital Correlated Double Sampling

Explore the benefits of Digital Correlated Double Sampling (DCDS) in scientific detector workshops. Learn how this technology minimizes complexity, optimizes signal processing, and improves system performance.

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Enhancing Focal Plane Electronics with Digital Correlated Double Sampling

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  1. DCDS for roundtable Paul Jorden 10 Oct 2013 Scientific Detector Workshop, Florence e2v Matthew Bastable and others RAL Matthew Clapp and others

  2. The motivation • Integrated Focal Plane Electronics • Readout electronics for large focal plane arrays • Prototyping a test systems using DCDS. • Digital Correlated Double Sampling (DCDS) • Moves a significant proportion of the signal processing into the digital domain • Minimise complexity and size of analogue electronics JPAS focal plane 224 signal channels

  3. DCDS Processing • Limited to sampling the settled output voltage • Sample frequency/pixel frequency > 14 • 16-bit accuracy • System bandwidth at ADC nyquist frequency • 10% clamp period

  4. Video Chain • Digital Correlated Double Sampling (DCDS) Analogue Digital CCD Video signal conditioning OS DCDS OversamplingADC Video Data DOS • Digital low pass filter • Correlated double sampling • DC restore • Anti-alias filter • Single ended to differential • Remove reset feed-through ADC output (ADU) Reference samples (ri) CCD OS 20V Signal samples (si)

  5. DCDS Prototype DCDS Video Card CCD203 SDO CEB

  6. Concept for J-PAS • Use differential signals for best common-mode noise rejection Get √2 noise increase • Use DCDS for optimal noise of system • 100 MHZ sampling frequency; 500 kHz pixel rate • DCDS better than analogue CDS and recovers some of the loss of differential mode. References • Clapp SPIE 2012, 8453-49 DCDS • Jorden et al. SPIE 2012, 8453-20. J-PAS

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