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Presentation is based on: Magnetic imaging in the presence of external fields: Technique and applications Romel D. Gomez, Edward R. Burke, Isaak D. Mayergoyz Department of Electrical Engineering, University of Maryland, College Park, Maryland Presentation by: Muhammad Aslam

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  1. Presentation is based on: Magnetic imaging in the presence of external fields: Techniqueand applications RomelD. Gomez, Edward R. Burke, Isaak D. Mayergoyz Department of Electrical Engineering, University of Maryland, College Park, Maryland Presentation by: Muhammad Aslam Roll No.2

  2. Outlines • About the technique • Magnetic Force Microscopy, basic operation • Tip-sample interaction • Magnetic design • Probe magnetization effect • Probe hysteresis effect • MFM image of magneto-optic medium • Erasure of thin film recording medium with increasing field • Erasure of magneto optic marks with temperature

  3. About the Technique • Most MFM images are obtained under ambient magnetic field conditions, so studies was limited to sample locally non magnetized or remanent states • With this technique, imaging samples in the presence of external field has allowed direct imaging of microscopic evolution of thin film recording pattern, dc erasure, investigating magnetic properties of surfaces at any point along magnetization curve, motion of domain walls etc

  4. Basic operating principle of MFM

  5. Tip sample interaction

  6. Tip magnetization

  7. Image contrast

  8. Magnet Design

  9. Electromagnet characteristics curves

  10. Probe Effect: Component resolved imaging , • Electromagnet OFF • Sample In-plane magnetization • Probe orientation • Along z-axis; 3.5 Koe; • Along x-axis; 200 Oe • Along y-axis

  11. Probe Hysteresis Effect

  12. MFM images of magneto optic medium • Tip (+) & Tip (-) indicates vertically premagnetized probe • Arrows indicate direction of 600 Oe in-plane external field

  13. T h a n kY o U

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