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GaAs:Cr for HEP – radiation tests

GaAs:Cr for HEP – radiation tests. IHEP, Protvino NCPHEP, Minsk SIPT, Tomsk ICBP, Puschino. Our predecessors. RD-20, CERN Si, GaAs RD-48, CERN Si, GaAs A. Vorobiev, IHEP GaAs, Si P. Sellin e al, 1995 GaAs

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GaAs:Cr for HEP – radiation tests

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  1. GaAs:Cr for HEP – radiation tests IHEP, Protvino NCPHEP, Minsk SIPT, Tomsk ICBP, Puschino Prague, April 17, 2004

  2. Our predecessors • RD-20, CERN Si, GaAs • RD-48, CERN Si, GaAs • A. Vorobiev, IHEP GaAs, Si • P. Sellin e al, 1995 GaAs neutrons, 1 MeV, fluence up to 11014 n/cm-2 A. Vorobiev, IHEP, 2002 GaAs cooling, temperature dependence FNAL, D0 report, 2002 Silicon detectors from ELMA, ST, Ham., … and many others Prague, April 17, 2004

  3. Doping GaAs by Chromium –the 5-year practice ofa new technology in Tomsk • ResistiveSi structures have not been obtained so far. • World studies of GaAs irradiation tolerance related mainly to GaAs structures of the previous generation. A new unique production technology of resistive GaAs:Cr (doped by Chromium) belongs to Tomsk. As was earlier shown by estimates and by the first measurements (Protvino, RAL), GaAs:Cr radiation hardness can be higher than that of Si by a factor of 10 or larger. Prague, April 17, 2004

  4. GaAs pad 1cm1cm Cigarette lighter General view Prague, April 17, 2004

  5. a – taken as for Ge with Z=32 and A=72.6 and =5.32 g/cm3. b – calculated as Ec = 610 MeV/(Z+1.24) c – calculated as RM = X021 MeV/Ec GaAs:Cr general properties Prague, April 17, 2004

  6. GaAs vs Si ! ! Prague, April 17, 2004

  7. GaAs test series in Nov. 2003 – Jan. 2004 • Proton beam at IHEP booster • Gamma source in Puschino • Data analysis in Protvino and Tomsk Prague, April 17, 2004

  8. Absorbed dose – is it known accurately? -- YES • Direct measurement with Al foils -- Г.И. Бритвич • Verification with booster beam profiles – А.С. Гуревич Mrad 0.4 3.5 120 Fluence, p/cm**2 1.7·1013 1.5·1014 5.0·1015 Prague, April 17, 2004

  9. VACsbefore /after GaAs diodes NN= 17 Low beam intensity Ip=21011 p/pulse 0.4 Mrad Mrad 2 Mrad NOTE. Diode N3 was irradiated up 40 Mrad, and later it was found to be damaged mechanically due to an unknown reason. 3.5 Mrad N3 20 Mrad 40 Mrad 80 Mrad 120 Mrad Prague, April 17, 2004

  10. Stand at work A.G. Kholodenko, 14.01.2004 Это сбор заряда от напряжения, просто данные и центры тяжести сигнального и пъедестального пиков. Prague, April 17, 2004

  11. GaAs:Cr 1cm•1cm detectors in 1.7 GeV/c proton beam (Dec. 2003) 14 GaAs detectors.were exposed, and 7 of them to ‘low lintensity’ beam with 21011 p/pulse and 7 to high-intensity beam with 61011p/pulse. The absorbed doses were the same in both sets and they corresponded to fluences from 21013p/cm2 to 51015p/cm2 . Prague, April 17, 2004

  12. Prague, April 17, 2004

  13. GaAs N15 and N16 irradiated by gammas • source: Co2760 , E = 1.25 MeV • Dose rate 96 Krad/hour • Absorbed dose 5 Mrad NOTE. Unfortunately, no curves obtained before irradiation Prague, April 17, 2004

  14. GaAs: Cr 1cm•1cm detectors at gamma irradiation (Jan. 2004) The detectors were exposed to  source with the gamma energy 1.25 MeV. The absorbed doses ranged from 5 to 51 Mrad . The figures show the full tolerance of GaAs to the gamma fluxes within this load range. Prague, April 17, 2004

  15. Conclusion О.П. Толбанов говорит: Вывод 3: В GaAs вдвое выше плотность ионизации, втрое выше быстродействие и в 5 раз выше амплитуда импульсов наведённого тока. Вывод 4:GaAs в сравнении с Si имеет радиационную стойкость более,чем на 2 порядка выше. GaAs detectors provide: • Stronger signal: • Higher radiation hardness:  Tolerantleakage currents (no refrigeration) • New high-tech opportunities in HEP instrumentation • Applied science and interdisciplinary studies Prague, April 17, 2004

  16. We continue to work…We want • To continue studies in hadron beams up to a conclusive step. • To irradiate in neutron beams. • To perform a direct comparison with Si in the same experiments. • To involve interested parties. • To get a support. Prague, April 17, 2004

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