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Review of BEB requirements, block diagram, PCB layout, mass, power analysis, test results, GSE data acquisition, software capabilities, design status, issues, additional information on Floating Ground and Bias Drivers.
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Boom Electronics Board (BEB)Engineering Peer ReviewApr. 20, 2004Hilary Richard
BEB Requirements • Functional Requirements • Spin Plane Booms, for each provide: • Floating Ground Driver • “Bias”, “Guard”, “Usher” programmable potentials • “Braid” programmable, switchable potential • AC test signal source • Axial Booms, for each provide: • Floating Ground Driver • “Bias”, “Guard”, “Usher” programmable potentials • AC test signal source
BEB Parts Analysis • Parts Stress Analysis • Design meets derating guidelines of GSFC PPL-21 • Worst Case Temperature Analysis • Parts meet Temperature Guidelines • Operating Temperature range: –30C to 45C • Survival Temperature range: –50C to 65C • Only one “high” power device (Actel 54SX72) • Operating power dissipation: 63 mW
BEB ETU Mass and Power • Power • Estimated worst case power at PDR: 1667mW • Includes Preamp power of 324mW • Measured ETU operating power: 790mW • Including Preamp, total = 1114mW • Mass • Estimated mass at PDR: 504g • Measured ETU mass: 426g
BEB ETU Test Results DC Response of Floating Ground Driver, FL_GND2
BEB ETU Test Results, con’t. AC Response of Floating Ground Driver, FL_GND2
BEB ETU Test Results, con’t. DC Response of Bias Driver, BIAS1
BEB ETU Test Results, con’t. AC Response of Bias Driver, BIAS1
BEB ETU Test Results, con’t. • Preliminary Crosstalk Data • Set-up: • Signal Injected into Ref. Voltage of BIAS3 • VSphere3 = 10VPP, 150Hz • Output of neighboring BIAS Driver examined • Crosstalk observed on BIAS2: • VSphere2 not terminated • Signal Amplitude is -75.8dB (relative to 7.07VRMS ) • VSphere2 grounded • Crosstalk undetectable (< -103dB)
BEB / EFI Subsystem Test • Integrated Testing • Includes: • BEB, Boom wire, Preamp • Sensor Boxes with Plasma Simulator (R║C) • GSE Automated Data Acquisition • Test Results • DC Tests • Isolation, Sensor biasing, Usher/Guard Biasing, Braid biasing • DC Gain/Offset • AC Tests • AC input impedance, Transfer function, Crosstalk, Noise level • Linearity, Slew rate
BEB GSE Data Acquisition • Capabilities: • Supports Automated test of Flight Hardware • “VME-style” backplane • Accepts BEB and DFB • DCB-simulator implements CDI command • 16-Channel 16-bit ADC (±100V range) • 6 Vsphere, 2 Braid, 2 Usher, 2 Guard, 2 Flt. Gnd • Programmable Signal Source w/ • ±60Vdc offset range • 30mV to 15Vpp AC (DC-16kHz) • 1mV to 500mVpp AC (100k – 500kHz) • LVPS and PCB simulation • Power services programmable on/off • +5VD, +2.5VD, ±10VA, ±100VA • Current monitors
BEB GSE Software • Capabilities: • Scripted or interactive entry of CDI, GPIB, and DAQ commands • Continuous analog acquisition mode with real-time stripchart displays • “One-shot” acquisition mode for detailed examination, processing, and archival of analog input data • MATLAB interface • TCP/IP interface allows GSE to be controlled via remote host • Full access to CDI, GPIB, analog and digital I/O commands • Interface libraries allow GSE functions to be accessed just like native MATLAB commands • Device control • GPIB programmable function generator serves as signal source • DAQPad 16-input, 16-bit, 333 kSamp/sec for analog data acquisition • DAQPad analog and digital outputs serve as controls for signal source amplifier, LVPS switching, and current monitor MUX • TCP/IP interface to 6U VME GSE Interface Board for sending CDI commands
BEB Design Status • Completed ETU Design and Fabrication • Characterization w.r.t. DC gain and AC response • In progress • Available for testing with Preamp prototypes • EFI Sensor Test Program • GSE Data Acquisition system completed • Integrated tests with preamps and boom units • Issues • Actel 54SX72 failures, total of 4 out of 7 • 2 failed programming • 2 failed “in circuit”, cause unknown
BEB Add’l Info • Additional slides included: • Floating ground driver schematic • Bias driver schematic
Floating Ground Driver • Heritage Design • CLUSTER, POLAR, FAST • Minor changes in part selection
Bias Driver • Heritage Design • CLUSTER, POLAR, FAST • Minor changes in parts selection and DAC