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High Energy Plume Impingement on Spacecraft Systems AFOSR Telecon

High Energy Plume Impingement on Spacecraft Systems AFOSR Telecon. Jarred Alexander Young December 10, 2012. Current Status. Filament power supply has been repaired and returned Beam Testing can continue

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High Energy Plume Impingement on Spacecraft Systems AFOSR Telecon

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  1. High Energy Plume Impingement on Spacecraft SystemsAFOSR Telecon Jarred Alexander Young December 10, 2012

  2. Current Status • Filament power supply has been repaired and returned • Beam Testing can continue • Research methods of incorporating data filtering with measurements through Keithley instruments • Looked into LabView commands and programming structure for Keithley instruments

  3. Retarding Potential Analyzer • Used to measure the energy distribution of particle beams • Consists of: • Ground grid-allows beam to bias grid to beam bias • Retarding grid- sweeps multiple potentials to repel lower energy particles while higher-energy particles pass freely • Supression grid- prevents oppositely-charged particles from affecting data Fig.1: RPA Conceptual Diagram [1]

  4. Outline of Beam Testing Method • Beam focused through energy analyzing grid aperture current measured by encased collector • Retarding sweep provided by KE2410 Sourcemeter • Current measurements provided by KE6485 picoammeter • Beam sweep conducted remotely through LabView • FC-71-A includes: • Floating/ground grid, “G” • Retarding Grid, “R” • Supression grid for secondary electrons, “S” • Faraday cup for current collection Fig. 2: FC-71-A Layout [2]

  5. Beam Analysis Processing • Both Keithley devices contain internal data filtering schemes • Moving- allows for readings to be averaged over a period of time and only takes to account the most recent readings until the procedure is completed • Repeating- allows reading from one source level to be averaged after a certain number of points to produce one reading and does not average data from other levels • Useful for source sweeps • Filtering must be activated prior to sweep to smooth data

  6. LabView Issues • Learning LabView commands for Keithley instruments through example files • Commands in current program provide little documentation • Example programs do not use all the commands available • Context help (as pictured on right) indicates each terminal’s function, but not options and their significance • More documentation in user’s manuals for instruments, but not completely relatable to LabView

  7. LabView Issues • Consulted with National Instruments on documentation issues • Talked about upgrading to commands that are NI-supported • Right-clicking on new commands terminals should allow for access to constants • Discovered this works with older commands as well

  8. LabView Issues • Keithleydrivers come with “VI Tree” which shows the user the general programming path in LabView for their instruments • Can use this to figure out how to edit current programs with filter commands

  9. Upcoming Tasks • Re-integrate and test filament power supply • Augment LabView programs to allow for both filtering of Picoammeter results and Sourcemeterresults • Perform beam testing while measuring current levels of all power supplies • Compile test matrix of energy levels

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