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SEB C-S measurements of power IGBTs

SEB C-S measurements of power IGBTs. Viliam Senaj, TE/ABT/FPS RadWG meeting 23/08/2012. Motivation. R eliable operation of LHC dump system - critical importance for machine safety 15 MKD generators per beam using GTO like thyristors

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SEB C-S measurements of power IGBTs

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  1. SEB C-S measurements of power IGBTs Viliam Senaj, TE/ABT/FPS RadWG meeting 23/08/2012

  2. Motivation • Reliable operation of LHC dump system - critical importance for machine safety • 15 MKD generators per beam using GTO like thyristors • GTO are trigged by“power trigger units” operating at up to 3 kV and populated by 3 IGBTs (1.2 kV rated) in series; 360 IGBTs in total for MKDs and 120 for MKBs • SEB of IGBT will provoke “Asynchronous Dump” with associated beam losses and risk of damage of downstream equipments • Replacement of 1.2 kV rated IGBT by 1.7 kV one with similar performance should reduce significantly risk of SEB • SEB measurement to justify replacement costs

  3. IGBT protection against destructive SEB • Reduction of test costs and irradiation facility time by “non-destructive SEB test” – DUT current limitation and voltage cut-off in case of SEB detection • SEB recording by a low frequency data logger (current consumption dip of the assembly of 6 IGBTs due to voltage cut-off on a DUT that experienced an SEB) • Local counter of SEBs – for comparison

  4. Example of data logger recording Example of currrent consumption dips with different durations for SEBs of different IGBTs

  5. SEB Cross-section of IXDN75N120 vs. IXGN100N170 Results of SEB measurement: 1.2 kV IGBTs would result in ~ 4 asynchronous dumps (~10-5 HeH/cm-2.year; 1kV; 360 IGBTs); for 1.7 kV IGBTs factor of ~ 107 less

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