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Nanotube Tip Performance on Silicon Surface Analysis

Explore new data on nanotube tip behavior on a silicon surface across different conditions and measurements. Investigate variations in amplitude, phase, force gradient, and dissipation during tracing and retracing operations.

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Nanotube Tip Performance on Silicon Surface Analysis

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  1. 04290942 Ntb_si_new2_a Q=176, k=4.8 Nm, DA=822 mV, senst. 19.44 nm/V Nanotube length 45 nm, f=61.94 kHz Ntb_Si_probe3_low_ediss_trace Ntb_Si_probe3_low_ediss_retrace Ntb_Si_probe3_low_ampl_trace Ntb_Si_probe3_low_ampl_retrace Ntb_Si_probe3_low_forcgrad_trace Ntb_Si_probe3_low_forcgrad_retrace Ntb_Si_probe3_low_phase_trace Ntb_Si_probe3_low_phase_retrace New data for a Ntb tip on a silicon surface

  2. 04290939.4 Ntb_si_new2_b Q=176, k=4.8 Nm, DA=1126 mV, senst. 19.44 nm/V Nanotube length 45 nm, f=61.94 kHz Ntb_Si_probe3_interm_ediss_trace Ntb_Si_probe3_interm_ediss_retrace Ntb_Si_probe3_interm_ampl_trace Ntb_Si_probe3_interm_ampl_retrace Ntb_Si_probe3_interm_forcgrad_trace Ntb_Si_probe3_interm_forcgrad_retrace Ntb_Si_probe3_interm_phase_trace Ntb_Si_probe3_interm_phase_retrace New data for a Ntb tip on a silicon surface

  3. Q=176, k=4.8 Nm, DA=2100 mV, senst. 19.44 nm/V Nanotube length 45 nm, f=61.94 kHz 04291904.4 Ntb_si_new_b Ntb_Si_probe3_high_ampl_trace Ntb_Si_probe3_high_ampl_retrace Ntb_Si_probe3_high_ediss_trace Ntb_Si_probe3_high_ediss_retrace Ntb_Si_probe3_high_phase_trace Ntb_Si_probe3_high_phase_retrace Ntb_Si_probe3_high_forcgrad_trace Ntb_Si_probe3_high_forcgrad_retrace

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