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EEPROMs for Space Applications

EEPROMs for Space Applications. R. Koga Space Science Applications Laboratory The Aerospace Corporation 9-27-2000. Outline. Test devices SEE test results SEL sensitive devices Repackaged devices Same technology Summary. Test Devices. Device Memory

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EEPROMs for Space Applications

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  1. EEPROMs for Space Applications R. Koga Space Science Applications Laboratory The Aerospace Corporation 9-27-2000

  2. Outline • Test devices • SEE test results • SEL sensitive devices • Repackaged devices • Same technology • Summary

  3. Test Devices Device Memory TypeOrganizationMfrTechGate AT28C256 32k x 8 Atmel CMOS FG* HN58C1001 128k x 8 Hitachi CMOS FG* W28C256 32k x 8 NGC CMOS SONOS FG *FG = Floating Gate

  4. SEE Test Results for AT28C256(Average of Two Samples)

  5. AT28C256 (32k x 8) EEPROM • Read errors • 1. Output Data Buffer • 2. Control Section • SEL • Threshold LET

  6. SEFI(Single Event Functional Interrupt) • Named in 1996 / Long History • A Type of SEE • SEFI leads to a temporary non-functionality (or interruption of normal operation) of the affected device. • Cause/Mitigation/Recovery

  7. SEE for HN58C1001 EEPROM

  8. HN58C1001 (128k x 8) EEPROM • Read errors • 1. Output Data Buffer • 2. Control Section • SEL immune • Temperature

  9. HN58C1001 (128k x 8) EEPROM(cont.) • Temperature specification • 0°C < Temp < 70°C • Repackaged devices • -40°C < Temp < 120°C

  10. HN58C1001 (128k x 8) EEPROM(cont.) • Write errors at low temp (about -10°C) • 1. Delay time • tCS > 1 s • tWS > 1 s • Power turn on • Accidental write procedure

  11. Functional block diagramSA3823

  12. SA3823 SEE Sensitivity F.W. Sexton, et al., IEEE Radiation Effects Data Workshop, p55, 1994.

  13. Examples of ions available for radation effects testing of SA3823 at the LBNL 88-inch cyclotron facility. EnergyLET Range Ion AW (MeV) (MeV/ in Si Species [mg/cm2]) (µm) H 1 55 .01 >100 H 1 15 .03 >100 He 4 12 .35 >100 B 11 45 1.6 80 N 15 67 3.2 55 Ne 20 90 5.6 45 Ar 40 180 15 46 Cu 65 290 30 45 Kr 86 380 41 46 Xe 136 600 63 50 Bi 209 950 95 50

  14. Functional block diagram of W28C256

  15. Examples of ions available for radation effects testing of W28C256 at the LBNL 88-inch cyclotron facility. EnergyLET Range Ion AW (MeV) (MeV/ in Si Species [mg/cm2]) (µm) B 11 108 .9 >100 O 18 183 2.2 >100 Ne 22 216 3.4 >100 Ar 40 400 10 80 V 51 508 15 55 Cu 65 659 22 45 Ge 73 725 25 46 Kr 86 886 30 45 Mo 98 983 38 46 Xe 136 1330 54 50 Xe 136 1404 54 50

  16. W28C256 EEPROM • SEE sensitivity differences • SEE during Write • SEE during Read

  17. Aerospace SEE Test Facility • High Capacity Motion Table • Fast Pumping (Mechanical, TM, and Cryo-pumps) • Laser/Computer Assisted Positioning • Variable Beam Size • Integration of Particle Counting and SEE Detection

  18. Aerospace SEE Test Facility(cont.) • Cocktail Beams • Copious Beams • Fast Ion Counting System • Beam Uniformity and Energy Detection

  19. Summary • SEE sensitivity at room temperature • Repackaged devices • Similar technology • Test results

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