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Single Event Latchup (SEL)

Single Event Latchup (SEL). Definitions.

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Single Event Latchup (SEL)

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  1. Single Event Latchup(SEL)

  2. Definitions Single Event Latchup (SEL) is a potentially destructive condition involving parasitic circuit elements forming a silicon controlled rectifier (SCR). In traditional SEL, the device current may destroy the device if not current limited and removed "in time." A "microlatch" is a subset of SEL where the device current remains below the maximum specified for the device. A removal of power to the device is required in all non-catastrophic SEL conditions in order to recover device operations.

  3. Latchup Basics From Harris

  4. Latchup BasicsEquivalent Circuit

  5. 6.41 m EPI Layer, Latchup, and Ion Range

  6. SEL - QL3025 0.35 m BNL 02/98 S/N QL1 Run T2 VBIAS = 5.0V, 3.3V Titanium @ 0 Deg LET = 18.8 MeV-cm2/mg

  7. Chip Express Latchup Comparison

  8. SELTH Variability S/N Lot No. D/C Threshold X-Sec Prolonged Latchup Allowed? A1 U1P126 9646 52.9 1.5E-06 no A4 U1P061 9402 52.9 4.50E-06 no B1 U1P054 9851 52.9 3.4E-07 no B2 U1P054 9851 43.2 2.0E-06 no B3 U1P054 9851 52.9 3.0E-06 yes B4 U1P054 9851 52.9 1.5E-06 yes B5 U1P054 9851 > 74.7 no latchup - B6 U1P054 9851 > 74.7 no latchup - C1 U1P054 9844 52.9 3.0E-06 no C2 U1P054 9844 43.2 no data @75 yes C3 U1P054 9844 74.7 no data @75 no D1 U1P126 9704 43.2 6.7E-06 no D2 U1P126 9704 43.2 9.4E-06 no D3 U1P126 9704 43.2 no data @75 yes D4 U1P126 9704 < 37.4 no data @75 yes D5 U1P126 9704 < 43.2 no data @75 yes • SEL Summary for A1020B. A large set of parts from multiple lots were tested, showing a wide range of SEL LETTH and latchup currents. Some latchups were destructive with either higher ICC or functional failure.

  9. Distribution of Peak Latchup Currents for the A1020B (MEC)

  10. Single Event LatchupIon Energy Dependence

  11. Latchup Summary Device Type * Pre-prod. RH1020 QL24X32B RT54SX16/32* A54SX32A* QYH530 CX2041 CX3001 A54SX16* QL3025 XQR4062XL* Size/Voltage (nominal core) 1.0 m / 5.0 0.65 m / 5.0 0.8 m / 3.3 0.25m / 2.5 0.8 m / 5.0 0.6 m / 2.5 0.35m / 3.3 0.35 m / 3.3 0.35 m / 3.3 0.35 m / 3.3 Threshold (MeV-cm2/mg) > 74 < 18 > 120 High 52 > 37 Low > 74 < 11 > 100 Comments Destructive One-Mask LPGA Destructive

  12. Single Event Latchup

  13. Ex. SEL Detection and Clearing Note that FPGA have high I/O count with diodes to VCC and GND in most cases.

  14. SEL Test Results Shutter Opened

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