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This study presents a detailed analysis of signal delays measured at different nanosecond intervals (10ns, 20ns, 30ns, 40ns, 50ns, and 60ns). The figures illustrate the trends observed in signal performance over time, highlighting the effects of increasing delay on system behavior. Figures 7, 8, and 9 each represent testing results at specified intervals, providing insights into time-related challenges in electronic systems. The findings are crucial for understanding signal integrity and timing in high-speed circuits.
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