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PSI test REPORT APRIL 2011

PSI test REPORT APRIL 2011. G. Spiezia, P. Peronnard (EN/STI/ECE). Outline. Devices under tests Experimental setup Beam setup and results Conclusions. Devices under test. Setup. PIF facility at PSI 230 MeV proton beam Flux: up to 1.65E+08 p/cm 2 /s Experiment

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PSI test REPORT APRIL 2011

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  1. PSI test REPORT APRIL 2011 G. Spiezia, P. Peronnard (EN/STI/ECE)

  2. Outline • Devices under tests • Experimental setup • Beam setup and results • Conclusions

  3. Devices under test

  4. Setup • PIF facility at PSI • 230 MeV proton beam • Flux: up to 1.65E+08 p/cm2/s • Experiment • Power supply E3633A for the input signal and the supply voltage to monitor the Single Event Latch up (SEL) • Power supply E3648A (double output) for powering the DUT • Tektronix DPO7254 oscilloscope (2.5GHz, 40GS/s) to monitor Single Event Transient (SET) • Data AcquistionSwitch Unit Agilent 34970A for monitoring the DUT outputs. 8 channelsweresequentiallymonitored (up to 32).

  5. Setup GPIB Instruments Ethernet to GPIB GUI interface for remote control and logging Ethernet switch DUT Actel Evaluation Board for digital DUT BEAM RS232 serial link

  6. Schematics BCP56/BSR17 – 8 transistors on the test board

  7. Schematics BCP53/BSR18A – 8 transistors on the test board

  8. Schematics HCPL2601

  9. Schematics MAX11046

  10. Test methodology for the ADC • An off-line calibration is done • For each channel, the min and max values are stored in a register file • The beam is enabled • The FPGA checks if a sample is outbound, if yes, the sample is sent to the control PC • Channels 0 to 3 were set to 2.5V with a power supply (use of a calibrator would be better but not practical) • Channels 4 to 7 were set to 0V with a short-circuit NB: no external memory is available on the evaluation board. It is not yet possible to get an histogram of the samples. The obtained results are preliminary.

  11. Beam Run

  12. Results – Overview • no SET were observed with our test setup • Drift observed on the gain of the transistors and the reference output of the ADC • No destruction for the transistor • No events observed on the optocoupler • The ADC stopped to work after 200Gy

  13. Results – BCP53

  14. Results – BCP56

  15. Results – BSR17A

  16. Results – BSR18A

  17. Results – MAX11046 • A drift of 4mV was measured on the reference pin

  18. Conclusions • No destruction and no SET were observed for the transistors with our test setup • Drifts were observed on the gain of the transistors • The preliminary results of the ADC shown that it is sensible to SEE and it is susceptible to break after 200Gy (read values are always 0x0000 or 0xFFFF)

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