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The Magnetic Resonance Force Microscope (MRFM) merges the imaging capabilities of magnetic resonance with the resolution of atomic force microscopy. By detecting mechanical forces exerted by spins under high magnetic field gradients of ~Gauss/nanometer, MRFM offers exceptional sensitivity. This technology facilitates non-destructive imaging at high spatial resolution, enabling detailed studies of subsurface properties in various materials. This presentation will cover MRFM principles, applications in NMR, ESR, and FMR detection, and showcase high-resolution imaging of ferromagnetic microstructures.
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Ultrasensitive Magnetic Resonance with the Magnetic Resonance Force Microscope Chris Hammel Department of Physics & Electrical and Computer Engineering The Ohio State University Abstract: The magnetic resonance force microscope (MRFM) is a novel scanned probe instrument which combines the three-dimensional imaging capabilities of magnetic resonance imaging with the high sensitivity and resolution of atomic force microscopy. Based on mechanical (force) detection of magnetic resonance, MRFM affords exceptional sensitivity. A high quality factor cantilever serves as a sensitive detector of the force exerted by spins in the sample under the influence of magnetic field gradients as large as ~ Gauss/nanometer generated by a micromagnetic cantilever tip. The magnetic field gradient also defines the location of the resonant spins as in Magnetic Resonance Imaging. Excellent spin sensitivity will enable very high spatial resolution in non-destructive, microscopic studies and imaging of subsurface properties of a broad range of materials. I will present the principles of the MRFM and discuss applications of the MRFM to the detection of NMR, ESR and Ferromagnetic Resonance (FMR). I will discuss high sensitivity detection leading to single electron spin magnetic resonance and show an example of high resolution imaging of ferromagnetic microstructures. Wed. Oct. 19th