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delay-fault testing tutorial

Delay Fault Testing Tutorial. 2. Outline. Common Fault Models (Review)Defects and Delay FaultsDelay Fault ModelsTransition FaultsPath Delay FaultsRobust Path TestNon-robust Path Test. Delay Fault Testing Tutorial. 3. Common Fault Models. Delay Fault Testing Tutorial. 4. Delay Fault Testing Tutorial.

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delay-fault testing tutorial

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    1. Delay-Fault Testing Tutorial Acknowledgement: This presentation is adapted from Professor Janak Patel’s tutorial on the same topic available on the web at: http://courses.ece.uiuc.edu/ece543/docs/DelayFault_6_per_page.pdf

    2. Delay Fault Testing Tutorial 2

    3. Delay Fault Testing Tutorial 3 Common Fault Models Here we shown some of the commonly used fault models that have appeared in the literature. The first two apply to the gate level and the third one to transistor-level models. The coupling and pattern interference faults have been considered thus far for memory circuits which are modeled at a functional level. However, these faults may receive more attention for logic testing as well as the dimensions of the devices shrink further.Here we shown some of the commonly used fault models that have appeared in the literature. The first two apply to the gate level and the third one to transistor-level models. The coupling and pattern interference faults have been considered thus far for memory circuits which are modeled at a functional level. However, these faults may receive more attention for logic testing as well as the dimensions of the devices shrink further.

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    23. Delay Fault Testing Tutorial 23 Exercise Consider the 4-Nand implementation of the XOR gate in the previous slide. There are six I/O paths hence 12 path delay faults. For each of these faults, determine if it is robustly testable, only non-robustly testable or not testable (functionally redundant). Provide justification for your answers.

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    29. Delay Fault Testing Tutorial 29 Timing for launch-off-capture Transition-delay fault testing

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    31. Delay Fault Testing Tutorial 31 Timing for launch-off-shift Transition-delay fault testing

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