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$Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride$

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride J. D. Perreault 1,2 , A. D. Cronin 2 , H. Uys 2 1 Optical Sciences Center, University of Arizona, Tucson AZ, 85721 USA 2 Physics Department, University of Arizona, Tucson AZ, 85721 USA. Abstract.

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Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride