'Auger electron' presentation slideshows

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HfB 2 oxidized for 3 hours at 1250 o C in a 13%Ar-87%O 2 flow at 3.2 Torr

HfB 2 oxidized for 3 hours at 1250 o C in a 13%Ar-87%O 2 flow at 3.2 Torr

Discharge-Off. Ave. 13.6 m m. Ave. 25.1 m m. Discharge-On. (SEM images courtesy of Matt Gasch, NASA Ames). Collaborative Research: Oxidation of Ultra-High Temperature Ceramics in Dissociated Oxygen Environments Bridget Rogers, Vanderbilt University, DMR 0435843

By jereni
(83 views)

Nuclear Technology Exploring

Nuclear Technology Exploring

Nuclear Technology Exploring. 核技术勘查. 刘义保. 东华理工大学 核工程技术学院 2008-9-1. Chapter 1 Radiation Sources 1.1 Units and Definitions 1.2 Fast Electron Sources 1.3 Heavy Charged Particles Sources 1.4 Sources of Electromagnetics Radiation 1.5 Neutron Sources A

By varick
(113 views)

Electron Spectroscopy for Surface Analysis

Electron Spectroscopy for Surface Analysis

Electron Spectroscopy for Surface Analysis. Introduction XPS Background XPS Instrument How Does XPS Technology Work? Auger Electron Cylindrical Mirror Analyzer (CMA) Equation KE versus BE Spectrum Background Identification of XPS Peaks X-rays vs. e - Beam XPS Technology. Outline.

By neorah
(419 views)

Materials Characterization

Materials Characterization

Materials Characterization. Foothill College Nanotechnology Program. Overview. The case for materials characterization Approaches to characterization Categories of instrumental techniques Who uses these tools? What kinds of problems?. Instrument Rubric. What is the physics?

By lanai
(405 views)

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS). David Echevarría Torres University of Texas at El Paso College of Science Chemistry Department. XPS Background XPS Instrument How Does XPS Technology Work? Auger Electron Cylindrical Mirror Analyzer (CMA) Equation KE versus BE Spectrum Background

By alea-hall
(388 views)

Electron beam lithography (EBL)

Electron beam lithography (EBL)

Electron beam lithography (EBL). Overview and resolution limit. Electron source (thermionic and field emission). Electron optics (electrostatic and magnetic lens). Aberrations (spherical, chromatic, diffraction, astigmation). EBL systems (raster/vector scan, round/shaped beam)

By bernard-bray
(279 views)

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS). David Echevarría Torres University of Texas at El Paso College of Science Chemistry Department. XPS Background XPS Instrument How Does XPS Technology Work? Auger Electron Cylindrical Mirror Analyzer (CMA) Equation KE versus BE Spectrum Background

By oleg-kim
(206 views)

Calculation of atomic radiations in nuclear decay – BrIccEmis and beyond

Calculation of atomic radiations in nuclear decay – BrIccEmis and beyond

Calculation of atomic radiations in nuclear decay – BrIccEmis and beyond. T. Kib è di , B.Q. Lee, A.E. Stuchbery , K.A. Robinson. Tibor Kibèdi, Dep. of Nuclear Physics, Australian National University. DDEP Workshop, Paris, 8-10 October 2012. Outline. Talk is largely based on

By kirby-robbins
(124 views)

X-ray Photoelectron Spectroscopy (XPS)

X-ray Photoelectron Spectroscopy (XPS)

X-ray Photoelectron Spectroscopy (XPS). Center for Microanalysis of Materials Frederick Seitz Materials Research Laboratory University of Illinois at Urbana-Champaign. Electron Spectroscopies XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy

By jonas-harvey
(1242 views)

Auger Electron Spectroscopy (AES) Consumption Market Segments by Application 2021

Auger Electron Spectroscopy (AES) Consumption Market Segments by Application 2021

Global Auger Electron Spectroscopy (AES) Consumption Market is segmented on the basis of type as Protable Auger Electron Spectroscopy, and Desktop Auger Electron Spectroscopy.

By MarketInsights123
(35 views)

Characterization of Nanomaterials…

Characterization of Nanomaterials…

Characterization of Nanomaterials…. And the magnification game!. During today’s notes, there will be a picture every other slide. Try to guess what common household item you’re looking at (it has been magnified quite a bit!!!). 1.

By curryj
(0 views)

Surfaces, Interfaces & Beyond

Surfaces, Interfaces & Beyond

UW- Madison Geoscience 777. Surfaces, Interfaces & Beyond. Peter Sobol Department of Geoscience University of Wisconsin - Madison. ELECTRON SPECTROSCOPIES FOR SURFACE ANALYSIS: X-ray Photoelectron Spectroscopy Auger Electron Spectroscopy. March 12, 2019. UW- Madison Geoscience 777.

By roxann
(0 views)

Energy of Light

Energy of Light

X-ray Photoelectron Spectroscopy ( XPS ) Text Book1: X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices Paul van der Heide , Wiley 2011 Text book 2 : Photoelectron Spectroscopy Principles and Applications: Hüfner , Stephan , Springer 2011. Energy of Light.

By lchandler
(4 views)

Probes used for analysis

Probes used for analysis

Photon. Electron. Probes used for analysis. Neutron. UiO. IFE. Waves/particles. Amplitude and phase. Wave length. Coherence. Monochromatic. Imaging/microscopy Visible light/Optical Electron SEM STEM TEM Diffraction X-rays Electrons Neutrons. Spectroscopy EDS X-rays EELS

By lemond
(0 views)

MENA3100

MENA3100

MENA3100. 1 st lecture Øystein Prytz General information, what to learn and some repetition of crystallography. General information. Lectures Based on D. Brandon and W. D. Kaplan "Microstructural characterization of materials". Second edition, published by Wiley, 2008.

By nbrister
(0 views)

Chemical/Compositional Analysis

Chemical/Compositional Analysis

Chemical/Compositional Analysis. Incident electron undergoes inelastic scattering causing ejection of core (inner shell) electron Energy loss of incident electron, or energy of ejected electron or x-ray, is characteristic of the target element

By chidester
(0 views)


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