Automatic test equipment - PowerPoint PPT Presentation

332:479 Concepts in VLSI Design Lecture 19 Introduction to Testing

332:479 Concepts in VLSI Design Lecture 19 Introduction to Testing. Definition of testing Automatic Test Equipment Fault Models Event-Driven Logic Simulation Summary. Michael Bushnell and David Harris Rutgers U. and Harvey Mudd College.

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Lecture 1 Introduction

Lecture 1 Introduction. VLSI realization process Verification and test Ideal and real tests Costs of testing Roles of testing A modern VLSI device - system-on-a-chip Course outline Part I: Introduction to testing Part II: Test methods Part III: Design for testability.

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