'Chip fallout' diaporamas de présentation

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Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal

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VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 24, 2012, 4:00-5:00PM. Contents.

196 views • 19 slides

VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Yield and manufacturing cost Clustered defect yield formula Defect level Test data analysis Example: SEMATECH chip Summary Problems to solve. VLSI Chip Yield.

515 views • 18 slides

VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Yield and manufacturing cost Clustered defect yield formula Defect level Test data analysis Example: SEMATECH chip Summary Problems to solve. VLSI Chip Yield.

191 views • 18 slides