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FUNCTIONAL RAM TESTING

FUNCTIONAL RAM TESTING

FUNCTIONAL RAM TESTING. Christian LANDRAULT landraul@lirmm.fr. SUMMARY. Introduction Memory modeling Failure mechanisms and fault modeling Test algorithms for RAM. Introduction. Memories (esp. RAM) are at the forefront of commercial electronic designs

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1.03k views • 72 slides
Introduction to IC Test

Introduction to IC Test

Introduction to IC Test. Tsung-Chu Huang ( ??? ) Department of Electronic Eng. Chong Chou Institute of Tech. Email: tch@dragon.ccut.edu.tw 2004/05/24. Introduction to Memory Testing Outline. Basic Concepts about Memory/Storage Introduction to RAM/ROM Structure

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568 views • 34 slides
Introduction to IC Test

Introduction to IC Test

Introduction to IC Test. Tsung-Chu Huang ( ??? ) Department of Electronic Eng. Chong Chou Institute of Tech. Email: tch@dragon.ccut.edu.tw 2004/05/24. Introduction to Memory Testing Outline. Basic Concepts about Memory/Storage Introduction to RAM/ROM Structure

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346 views • 34 slides
Overview on Memory Faults And March Tests

Overview on Memory Faults And March Tests

MEET 29/10/2004. Overview on Memory Faults And March Tests. LUIGI DILILLO. C O L U M N D E C O D E R. C O L U M N D E C O D E R. R O W DECODER. MEMORY ARRAY. 1999. 2002. 2008. 2005. 2011. 2014. I / O DATA. Introduction - Context.

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485 views • 33 slides
VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 25, 2013, 3:30-4:30PM. Contents.

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561 views • 26 slides
VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 28, 2012, 9:00-10:00AM. Contents.

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415 views • 26 slides
VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 25, 2013, 3:30-4:30PM. Contents.

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277 views • 26 slides
Design for Testability Theory and Practice Lecture 8: Memory Test

Design for Testability Theory and Practice Lecture 8: Memory Test

Design for Testability Theory and Practice Lecture 8: Memory Test. Memory organization Memory test complexity Faults and fault models MATS+ march test Address Decoder faults Summary References. RAM Organization. Test Time in Seconds (Memory Cycle Time 60ns).

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512 views • 25 slides
VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test

VLSI Testing Lecture 10: Memory Test. Memory organization Memory test complexity Faults and fault models MATS+ march test Address Decoder faults Summary References. RAM Organization. Test Time in Seconds (Memory Cycle Time 60ns). Size Number of Test Algorithm Operations. n 2

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274 views • 25 slides

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