'Delay defect' diaporamas de présentation

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal

531 views • 24 slides

Testing for Faults, Looking for Defects

Testing for Faults, Looking for Defects. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal vagrawal@eng.auburn.edu IEEE Latin American Test Workshop, March 2011 Keynote

391 views • 24 slides

Delay Defect Characteristics and Testing Strategies

352 views • 21 slides