'Delay fault testing' diaporamas de présentation

Transition Delay Fault Testing of Microprocessors by Spectral Method

Transition Delay Fault Testing of Microprocessors by Spectral Method. Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA. Outline. Introduction Defects and transition delay fault model Microprocessor testing Issues Problem and Approach

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