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A Diagnostic Test Generation System

A Diagnostic Test Generation System

A Diagnostic Test Generation System. Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama 36849 USA. Purpose. Identification of fault is useful in the characterization phase of design. Present ATPG tools emphasize fault detection.

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396 views • 26 slides
Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal

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528 views • 24 slides
Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal

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398 views • 24 slides
A Two Phase Approach for Minimal Diagnostic Test Set Generation

A Two Phase Approach for Minimal Diagnostic Test Set Generation

Mohammed Ashfaq Shukoor Vishwani D. Agrawal. A Two Phase Approach for Minimal Diagnostic Test Set Generation. Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849, USA. 14th IEEE European Test Symposium Seville, Spain, May 25-28, 2009. Outline. Introduction

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287 views • 19 slides
Diagnostic Test Generation and Fault Simulation Algorithms for Transition Faults

Diagnostic Test Generation and Fault Simulation Algorithms for Transition Faults

Diagnostic Test Generation and Fault Simulation Algorithms for Transition Faults. Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama 36849 USA. Outline. Purpose (motivation) Problem statement and contribution Introduction and background

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319 views • 17 slides

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